Computational optical metrology (Hauptvortrag): Bergmann, R. B.; Falldorf, C. 118. DGaO-Jahrestagung, Dresden (07.06.2017)

Computational optical metrology (Keynote Speech): Bergmann, R. B., Falldorf, C.; Klein, Th.; Agour, M., International Conference on Optical and Photonic Engineering (icOPEN 2016), Chengdu, China (27.09.2016)

Optical metrology for micro-parts (Invited Talk): Bergmann, R. B.; Agour, M.; Falldorf, C. DSPE Optics and Optomechatronics Symposium, Delft (28.09.2015)

Precision optical metrology without lasers (Invited Talk): Bergmann, R. B.; Burke, J.; Falldorf, C. Proc. Of SPIE 9524, International Conference on Optical and Photonics Engineering (icOPEN 2015),

Singapore (15.04.2015)

Optical metrology on the micro and nano scale (Invited Talk): Bergmann, R. B.; Burke, J.; Huferath-von Lüpke, S.; Falldorf, C., 4th International nanoManufacturing Conference (nanoMan 2014), Bremen (09.07.2014)

Nanophotonics in three dimensions: heading from microelectronics towards optical computing (Invited Talk): Bergmann, R. B.; Bülters, M.; Garcia-Ortiz, A.; Gutowski, J.; Lang, W. 2nd International Conference on System-Integrated Intelligence (SystInt 2014) Bremen (03.07.2014)

Quality inspection and logistic quality assurance of micro technical manufacturing processes

Agour, M.; von Freyberg, A.; Staar, B.; Falldorf, C.; Fischer, A.; Lütjen, M.; Freitag, M.; Goch, G.; Bergmann, R. B.

In: Cold Micro Metal Forming, eds. F. Vollertsen, B. Kuhfuß, C. Thomy, S. Friedrich, P. Maaß, H.-W. Zoch

Springer Nature Switzerland AG, Cham/CH (2020) 256-274

Inspection of functional surfaces on micro components in the interior of cavities

Simic, M.; Staar, B.; Falldorf, C.; Lütjen, M.; Freitag, M.; Bergmann, R. B.

In: Cold Micro Metal Forming, eds. F. Vollertsen, B. Kuhfuß, C. Thomy, S. Friedrich, P. Maaß, H.-W. Zoch

Springer Nature Switzerland AG, Cham/CH (2020) 275-288

Optical Metrology

von Kopylow, C.; Bergmann, R. B.

in: Micro Metal Forming, F. Vollertsen (Ed.)

(Springer, Berlin, 2013), 392 – 404

Advanced methods for optical non-destructive testing

Bergmann, R. B.; Huke, P.

In: Optical Imaging and Metrology: Advanced Technologies. Eds.: W. Osten, N. Reingand,

Wiley-VCH Weinheim (2012) 393-412

Interferometrische Submikrometer-Messtechnik in der Automobilindustrie

Bergmann, R. B.; Drabarek, P.; Kallmann, U.; Schmidtke, B.; Bauer J.

In: Photonik – Grundlagen, Technologie und Anwendung. Hrsg. E. Hering, R. Martin,

Springer Verlag Berlin-Heidelberg (2006) 263-281

Methoden der zerstörungsfreien Prüfung

Bergmann, R. B.; Zabler, E.

In: Handbuch der Mess- und Automatisierungstechnik in der Produktion. Hrsg. H. J. Gevatter,

U. Grünhaupt, Springer-Verlag Heidelberg (2006) 364-410

Growth, characterization and electronic applications of Si-based thin films

Bergmann, R. B. (Editor)

Research Signpost Trivandrum (2002)

Crystalline Si films on foreign substrates for electronic applications

Bergmann, R. B.

In: Recent Res. Devel. Crystal Growth Res.,

Managing Editor: S. G. Pandalai, Transworld Research Network, Vol. 1 (1999) 241-256

The challenge of crystalline thin film silicon solar cells

Werner, J. H.; Bergmann, R. B.; Brendel, R.

In: Festkörperprobleme / Advances in Solid State Physics 34. Hrsg.: R. Helbig, Vieweg Braunschweig (1994) 115-146

 2020

Quality inspection and logistic quality assurance of micro technical manufacturing processes

Agour, M.; von Freyberg, A.; Staar, B.; Falldorf, C.; Fischer, A.; Lütjen, M.; Freitag, M.; Goch, G.; Bergmann, R. B.

In: Cold Micro Metal Forming, eds. F. Vollertsen, B. Kuhfuß, C. Thomy, S. Friedrich, P. Maaß, H.-W. Zoch

Springer Nature Switzerland AG, Cham/CH (2020) 256-274

Inspection of functional surfaces on micro components in the interior of cavities

Simic, M.; Staar, B.; Falldorf, C.; Lütjen, M.; Freitag, M.; Bergmann, R. B.

In: Cold Micro Metal Forming, eds. F. Vollertsen, B. Kuhfuß, C. Thomy, S. Friedrich, P. Maaß, H.-W. Zoch

Springer Nature Switzerland AG, Cham/CH (2020) 275-288

2019

Shape measurements by means of common path methods in coherent imaging

Agour, M.; Müller, A. F.; Thiemicke, F.; Bergmann, R. B.; Falldorf, C.

10th International Conference for Laser Applications (ICLA 10), Kairo (2019) 37

3D imaging system based on spherical wave field synthesis

Falldorf, C.; Chou, P.-Y.; Prigge, D.; Bergmann, R. B.

Applied Sciences, (2019), 9(18), 3862; https://doi.org/10.3390/app9183862

Improving the calibration of phase measuring deflectometry by a polynomial representation of the display shape

Bartsch, J.; Kalms, M.; Bergmann, R. B.

Eur. Opt. Soc.-Rapid Publ. (2019) 15:20, https://doi.org/10.1186/s41476-019-0116-1

Phase measurement deviations in deflectometry due to properties of technical surfaces

Patra, S. K., Bartsch, J., Kalms, M., Bergmann, R. B.

Proc. SPIE 11102, Applied Optical Metrology III, 111020Q (2019); DOI:  http://dx.doi.org/10.1117/12.2527894

Assessing the Focal Length and Wavefront Error of Liquid Crystal Micro Lens Arrays

Chou, P.-Y., Prigge, D., Shieh, H. P. D., Bergmann, R. B., Falldorf, C.

In Digital Holography and Three-Dimensional Imaging, (Optical Society of America, 2019) pp. W2B-7

Simultaneous measurement of independent wave fronts using multiple signal classification

Falldorf, C., Müller, A. F., Agour, M., Bergmann, R. B.

In Digital Holography and Three-Dimensional Imaging, Optical Society of America, 2019) pp. M5A-5

Depth scanning using binary digital micro-mirror devices

Agour, M.; Falldorf, C., Bergmann, R. B.

in Digital Holography and Three-Dimensional Imaging 2019, OSA Technical Digest (Optical Society of America, 2019), paper W3A.22

Messen von asphärischen Linsenformen mittels räumlicher Kohärenz

Müller, A., Falldorf, C., Ehret, G., Bergmann, R. B.

tm – Technisches Messen, 0(0), pp. -. Retrieved 3 Jun. 2019, DOI: 10.1515/teme-2019-0025 (2019)

Ganzheitliche optische Messtechnik

Bergmann, R. B.; Falldorf, C.; Dekorsy, A.; Bockelmann, C.; Beetz, M.; Fischer, A.

Physik Journal 18 (2) S. 34 – 39 (2019)

In-line quality control using dimensional metrology of 3D metal parts printed by laser beam melting

Kalms, M.; Bergmann, R. B.

Proc. SPIE 10971, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure and Transportation XIII, 109710N (2019) doi: 10.1117/12.2514240

New approach to evaluate 3D laser printed parts in powder bed fusion-based additive manufacturing in-line within closed space

Kalms, M.; Narita, R.; Thomy, C.; Vollertsen, F.; Bergmann, R. B.

Additive Manufacturing 26 (2019) 161-165

Polymer-based holograms with individually adjustable structure angle

Klein, T.; Thiemicke, F.; Falldorf, C.; Bergmann, R. B.

Optical Engineering 58, 2 (2019) 025105-025105-7

2018

Autofocus in two-wavelength contouring for fast inspection of micro parts

Agour, M.; Falldorf, C.; Bergmann, R. B.

Sensors & Transducers, Vol. 226, Issue 10, October 2018, pp. 77-82

Spatial multiplexing and autofocus in holographic contouring for inspection of micro-parts

Agour, M.; Falldorf, C.; Bergmann, R. B.

Optics Express 26, 22 (2018) 28576-28588

Fast quality inspection of micro cold formed parts using telecentric digital holographic microscopy

Agour, M.; Falldorf, C.; Staar, B.; von Freyberg, A.; Fischer, A.; Lütjen, M.; Bergmann, R. B.

Proc. 5th Intern. Conf. on New Forming Technology (ICNFT 2018) MATEC Web of Conferences 190, 15008 (2018) doi.org/10.1051/matecconf/201819015008

Extended depth of focus using autofocus in two wavelength contouring for fast inspection of micro parts

Agour, M.; Thiemicke, F.; Falldorf, C.; Bergmann, R. B.

Proc. 1st International Conference on Optics, Photonics and Lasers (OPAL‘ 2018), IFSA Publishing, (2018) 205-208

Effects on non-ideal display properties in phase measuring deflectometry: A model-based investigation

Bartsch, J.; Nüß, J. R.; Prinzler, M.; Kalms, M.; Bergmann, R. B.

Proc. SPIE 10678, Optical Micro- and Nanometrology VII (2018) 106780Y1-10

Spatio-temporal sampling of the coherence function for step height measurements

Falldorf, C.; Hyra, A.; Simic, A.; Bergmann, R. B.

Proc. SPIE 10749, Interferometry XIX. SPIE Digital Library (2918) 107490Y-1-8; doi: 10.1117/12.2321145

Form metrology of optical surfaces based on partial coherent shearing interferometry in reflection

Hagemann, J.-H.; Falldorf, C.; Ehret, G.; Bergmann, R. B.

Proc. of the 18th International Conference & Exhibition (EUSPEN 2018), Venice/Italien (2018) online

Form determination of optical surfaces by measuring the spatial coherence function using shearing interferometry

Hagemann, J.-H; Falldorf, C.; Ehret, G.; Bergmann, R. B.

Optics Express 26 (2018) 27991-28001

FTS-Diamantdrehen strukturierter Oberflächen – Diamantdrehen mit erweiterten Freiheitsgraden

Holthusen, A. K.; Riemer, O.; Brinksmeier, E.; Thiemicke, F.; Falldorf, C.; Bergmann, R. B.

Wt Werkstofftechnik online 108, 11/12 (2018) 784

Characterization of technical surfaces by structure function analysis

Kalms, M.; Kreis, T.; Bergmann, R. B.

Proc. SPIE Vol. 10599, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XII, (2018) 1059924-1-8, DOI: 10.1117/12.2296309

Novel approach for shape measurement using light with low spatial coherence length

Klein, T.; Agour, M.; Hülsmann, T.; Schulze, P.; Falldorf, C.; Bergmann, R. B.

Proc. European Optical Society Biennial Meeting (EOSAM 2018), Delft/NL (2018) 249-250

Aktuelle Forschungsthemen zum Laserstrahleinsatz

Mittelstädt, C.; Blanke, N.; Czotscher, T.; Freiße, H.; Halisch, C.; Schultz, V.; Simic, A.; Stephen, A.; Tyralla, D.; Vetter, K.; Bergmann, R. B.

Schweißen und Schneiden 70, 9 (2018) 650-657

Lens inspection using multiple aperture shear interferometry: comparison to wave front sensing methods

Müller, A.; Falldorf, C.; Agour, M.; Hagemann, J.-H.; Ehret, G.; Bergmann, R. B.

Proc. der 119. Jahrestagung der DGaO. DGaO Proceedings (2018) ISSN 1614-8436

Metric for comparison of generic camera calibration

Prinzler, M.; Bartsch, J.; Kalms, M.; Bergmann, R. B.

Proc. SPIE Optical Engineering + Applications, San Diego/USA (2018) 107500I-1-9

Interlaboratory comparison measurements of aspheres

Schachtschneider, R.; Fortmeier, I.; Stavridis, M.; Asfour, J.; Berger, G.; Bergmann, R. B.; Beutler, A.; Blümel, T.; Klawitter, H.; Kubo, K.; Liebl, J.; Löffler, F.; Meeß, R.; Pruss, C.; Ramm, D.; Sander, M.; Schneider, G.; Wendel, M.; Widdershoven, I.; Schulz, M.; Elster, C.

Mess. Sci. Technol 29 (2018) 055010

Fast quality assurance of pipes

Simic, A.; Falldorf, C.; Bergmann, R. B.

Proc. European Optical Society Biennial Meeting (EOSAM 2018), Delft/NL (2018) 279-280

Multiple plane holographic projection using diamond turned holograms

Thiemicke, F.; Holthusen, A. K.; Bergmann, R. B.; Brinksmeier, E.

17th Workshop on Information Optics (WIO 2018) DOI 10.1109/WIO.2018.8643454

2017

Spatial multiplexing digital holography for speckle noise reduction in single-shot holographic two-wavelength contouring

Agour, M.; Klattenhoff, R.; Falldorf, C.; Bergmann, R. B.

Optical Engineering 56, 12 (2017) 124101-1-7, DOI: 0.1117/1.OE.56.12.124101

Kompensation der Abbildungsverzerrung in der digital holografischen Mikroskopie durch Einsatz eines telezentrischen Objektives

Agour, M.; Simic, A.; Falldorf, C.; Bergmann, R. B.

Fachbeiträge 8. Kolloquium Mikroproduktion, Bremen, 27.-28. November 2017, Hrsg.: F. Vollertsen, C. Hopmann, V. Schulze, J. Wulfsberg, BIAS Verlag (2017) 7-12, ISBN: 978-3-933762-56-6

Geometrische Auswertung digital holographischer Messungen im Bereich des Mikrokaltumformens

von Freyberg, A.; Agour, M.; Bergmann, R. B.; Fischer, A.

Fachbeiträge 8. Kolloquium Mikroproduktion, Bremen, 27.-28. November 2017, Hrsg.: F. Vollertsen, C. Hopmann, V. Schulze, J. Wulfsberg, BIAS Verlag (2017) 13-20, ISBN: 978-3-933762-56-6

Distortion free reconstruction in digital holographic microscopy

Agour, M.; Falldorf, C,; Bergmann, R. B.

Proc. of the Face2Phase Conference, Delft/NL (2017) 38

In-Line computational shear interferometry of insert moulded micro parts for optical application

Agour, M.; Flosky, C.; Riemer, O.; Falldorf, C.; Bergmann, R. B.

Advanced Manufacturing Technology (2016) doi:10.1007/s00170-016-9874-8 (online)

Speckle noise reduction in single-shot holographic two-wavelength contouring

Agour, M. ; Klattenhoff, R. ; Falldorf, C. ; Bergmann, R. B.

Proc. SPIE 10233, Holography: Advances and Modern Trends V, 102330R (2017); doi:10.1117/12.2264971

Computational methods in coherent optical metrology

Falldorf, C.; Agour, M.; Bergmann, R. B.

Proc. of AMA Conferences. AMA Publications, Wunstorf (2017) 239-243 (10.5162/sensor2017/B5.2)

Coherent imaging using the mutual intensity function

Falldorf, C.; Agour, M.; Bergmann, R. B.

Proc. of the Face2Phase Conference, Delft/NL (2017) 32

Computational Optical Metrology

Falldorf, C.; Bergmann, R. B.

Photonics Germany (2017) 64

Holographic 3D imaging through diffuse media by compressive sampling of the mutual intensity

Falldorf, C.; Klein, T.; Agour, M.; Bergmann, R. B.

Proc. of holography: Advances and Modern Trends V, eds.: M. Hrabovsky, J. T. Sheridan, A. Fimia.

SPIE Vol. 10233, SPIE Digital Library Bellingham WA (2017) 1023330-Q1-8

Sparse light fields in coherent optical metrology

Falldorf, C.; Hagemann, J.-H.; Ehret, G.; Bergmann, R. B.

Appl. Opt. 56, (F14-F19), (2017)

Virtual Shearing Interferometer with LED Illumination for Form Characterization of Optics

Hagemann, J.-H; Ehret, G; Andreas, B.; Bergmann, R. B.; Falldorf, C.

Proc. of the European Optical Society Annual Meeting (EOSAM 2016). European Optical Society (2017) 277-278

Error influences of the shear element in interferometry for form characterization of optics

Hagemann, J.-H.; Falldorf, C.; Ehret, G.; Bergmann, R. B.

Proc. SPIE Vol. 10329, Optical Measurement Systems for Industrial Inspection X, eds.: P. Lehmann, W. Osten, A. A. Goncalves jr. SPIE, Digital Library (2017) 103291T1-1

Distortion-free laser beam shaping for material processing using a digital micromirror device

Messaoudi, H.; Thiemicke, F.; Falldorf, C.; Bergmann, R. B.; Vollertsen, F.

Production Engineering – Research and Development 11, 3 (2017) 365-371

In-line quality control of micro parts using digital holography

Simic, A.; Freiheit, H.; Agour, M.; Falldorf, C.; Bergmann, R. B.

Proc. SPIE Vol. 10233, Holography: Advances and Modern Trends V, eds.: M. Hrabovsky, J. T. Sheridan, A. Fimia, SPIE Digital Library Bellingham WA (2017) 1023311

2016

Inspektion im Inneren von Mikrotiefziehbauteilen mittels digitaler Holografie

Simic, A.; Falldorf, C.; Bergmann, R. B.

Laser Magazin 4 (2016) 31

Holographic display system for dynamic synthesis of 3D light fields with increased space bandwidth product

Agour, M.; Falldorf, C.; Bergmann, R. B.

Optics Express 24 (2016) 14393-14405

Shape measurements of microscopic objects using computational shear interferometry

Agour, M.; Falldorf, C.; Bergmann, R. B.

Proc. of SPIE Vol. 9718, Quantitative Phase Imaging II, eds. G. Popescu, YK Parc. SPIE (2016) 97182M-1-8

Quantitative phase contrast imaging using a Nomarski microscope with variable shear distance

Falldorf, C.; Agour, M.; Kötter, J.; Bergmann, R. B.

Proc. of SPIE Vol. 9718. SPIE Digital Library (2016) 97182I-1-7

Realization of a shearing interferometer with LED multipoint illumination for form characterization of optics

Hagemann, J.-H.; Ehret, G.; Bergmann, R. B.; Falldorf, C.

DGaO Proceedings (2016) paper 20

Referenceless phase holography, a new 3D display method

Kreis, T.; Bergmann, R. B.

Proc. Digital Holography & Three -Dimensional Imaging, Heidelberg (2016) OSA

Technical Digest on Imaging and Applied Optics (2016) DTh4E.4 (online)

1 kHz 3.3 ìm Nd:YAG KTiOAsO4 optical parametric oscillator system for laser ultrasound excitation of carbon fiber-reinforced plastics

Puncken, O.; Mendoza Gandara, D.; Damjanic, M.; Mahnke, P.; Bergmann, R. B.; Kalms, M.; Peuser, P.; Wessels, P.; Neumann, J.; Schnars, U.

Applied Optics 55 (2016) 1310-1317

Internal inspection of micro deep drawing parts using digital holography

Simic, A.; Falldorf, C.; Bergmann, R. B.

Proc. Digital Holography & Three -Dimensional Imaging, Heidelberg (2016) OSA

Technical Digest on Imaging and Applied Optics (2016) DW1H.3 (online)

2015

Precision optical metrology without lasers

Bergmann, R. B.; Burke, J.; Falldorf, C.

Proc. SPIE 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015), eds.: Anand K. Asundi, Yu Fu, 952403-1-8 (2015) doi: 10.1117/12.2183451

Running droplet optical multiplexer

Brandhoff, L.; Akhtar, M.; Bülters, M.; Bergmann, R. B.; Vellekoop, M. J.

Optofluidics, Microfluidics and Nanofluidics 1 (2015) 62-68

A rapid prototyping framework for nano-photonic accelerators

Büter, W; Garcia-Ortiz, A; Ali, A; Mahmood, S; Arefin, S; Parsi Sreenivas, V; Bergmann, R B

Proc. 25th International Conference on Field Programmable Logic and Applications (FPL), London, 2015, pp. 1-4., doi: 10.1109/FPL.2015.7294004

Single shot lateral shear interferometer with variable shear

Falldorf, C.; Klattenhoff, R.; Bergmann, R. B.

Optical Engineering 54 (2015) 054105-1-6, doi: 10.1117/1.OE.54.5.054105

Digital holography and quantitative phase contrast imaging using computational shear interferometry

Falldorf, C.; Agour, M.; Bergmann, R. B.

Optical Engineering 54, (2015) 024110-1-7

Röntgen-Computertomograf für zerstörungsfreie Prüfung

Kalms, M.; Bergmann, R. B.

Laser Magazin 1 (2015) 39

Dynamic wave field synthesis: enabling the generation of field distributions with a large space-bandwidth product

Kamau, E., Heine, J., Falldorf, C., Bergmann, R. B.

Opt. Express 23, 28920-28934 (2015).

2014

Measuring the complex amplitude of wave fields by means of phase retrieval using partially coherent illumination

Agour, M.; Elshaffey, K.; v. Koyplow, C.; Bergmann, R. B.; Falldorf, C.

Proc. 7th International Workshop on Advanced Optical Metrology (Fringe 2013), ed. W. Osten. Springer-Verlag Berlin-Heidelberg (2014) 283-287

Nanophotonics in three dimensions: Heading from microelectronics towards optical computing

Bergmann, R. B., Parsi Sreenivas, V. V., Bülters, M., Garcia-Ortiz, A., Gutowski, J. and Lang, W.,

2nd Internat. Conf. on System-Integrated Intelligence (SysInt 2014), Bremen, 2.7.2014

Optical metrology on the micro and nano scale (Keynote)

Bergmann, R. B., Burke, J., Huferath-von Luepke S. and Falldorf C.

4th Internat. Conf. on Nanomanufacturing (NanoMan 2014), Bremen, 8.7.2014

Subsurface modification of crystalline silicon via ultra-short laser pulses for three dimensional separation

Bülters M.; Parsi Sreenivas, V. V.; Braun, A.; Teubner, U.; Bergmann, R. B.

Proc. 4th International Conference on Nanomanufacturing (nanoMan2014) 08.-10.07.2014 Bremen (CD-Rom)

3D DOEs in photosensitivem Foturan Glas

Bülters, M.; Kamau, E. N.; Parsi Sreenivas, V. V.; Falldorf C. Bergmann, R. B.

115. Jahrestagung der DGaO, Karlsruhe (11.06.2014)

Measurement of mould tool for laminar-flow carbon-fibre composite airplane wing cover

Burke, J.; Gesierich, A.; Li, W.; Bergmann, R. B.

Proc. Oldenburger 3D-Tage 2014, eds.: Luhmann, Müller. Wichmann Berlin (2014) 116-125

Messung eines Formwerkzeugs für einen Kohlefaser-Laminartragflächendeckel

Burke, J.; Gesierich, A.; Li, W.; Bergmann, R. B.

Oldenburger 3D-Tage (13.02.2014)

Precise optical metrology using computational shear-interferometry and an LCD monitor as light source

Falldorf, C.; Simic, A.; Ehret, G.; Schulz, M.; v. Koyplow, C.; Bergmann, R. B.

Proc. of the 7th International Workshop on Advanced Optical Metrology (Fringe 2013), ed. W. Osten. Springer-Verlag Berlin-Heidelberg (2014) 729-734

Calibration of a digital holographic microscope for wear detection

Huferath-von Lüpke, S.;Schröder, M.; Huke, P.; Bergmann, R B.

4th International Conference on Nanomanufacturing – nanoMan 2014, Bremen/Germany (10.07.2014)

Deflectometry vs. Shearography for detection of subsurface defects

Huke, P.; Burke, J.; Bergmann, R. B.

Proc. SPIE Vol. 9203, Interferometry XVII: Techniques and Analysis. eds: Katherine Creath, Jan Burke, Joanna Schmit, SPIE Bellingham (2014), 92030C, DOI: 10.1117/12.2063650

Advanced wave field sensing using Computational Shear Interferometry

Falldorf, C.; Agour, M.; Bergmann, R. B.

Proc. SPIE Vol. 9204, Interferometry XVII: Advanced Applications. SPIE Bellingham (2014), 92040C-1-9

Complete shape measurement of micro parts by digital holography

Huferath-von Luepke, S., Klattenhoff, R., Dankwart, C., Falldorf, C., Bergmann R.B.

Proc. of SPIE; Interferometry XVI: Techniques and Analysis, eds.: K. Creath, J. Burke, J. Schmit. SPIE Bellingham (2014) 920302-1-8

Digital holography for inline wear recording on deep drawing tools

Huferath-von Luepke, S.; Bergmann, R. B.

Proc. 4th International Conference on Nanomanufacturing (nanoMan2014) 08.-10.07.2014 Bremen (CD-Rom)

Efficient laser generation of Lamb waves

Huke, P.; Schröder, M.; Hellmers, S.; Kalms, M.; Bergmann, R.B.

Optics Letters 39 (2014) 5795-5797

Beam shaping using liquid crystal-on-silicon spatial light modulators for laser ultrasound generation

Kalms, M.; Hellmers, S.; Huke, P.; Bergmann, R. B

Optical Engineering 53 (2014) 044110-1-6

Fabrication of 3D DOEs in photosensitive Foturan Glass

Kamau, E. N.; Bülters, M.; Sanchez Alvarez, C.; Parsi Sreenivas, V. V.; Falldorf, C.; Bergmann, R. B.

4th International Conference on Nanomanufacturing – nanoMan 2014, Bremen/Germany (08.07.2014)

Surface characterization by structure function analysis

Kreis, Th.; Burke, J.; Bergmann, R. B.

J. Europ. Opt. Soc. Rap. Public 9 (2014) 14032-1-8

Optical Vector Matrix Multiplier for On-Chip Computation

Parsi Sreenivas, V. V; Bülters, M.; Dumstorff, G; Chauhan, A; Garcia-Ortiz, A; Bergmann, R. B.

European Optical Society Annual Meeting (EOSAM 2014) Berlin (CD-Rom)

Optical waveguides via laser micro machining

Parsi Sreenivas, V. V.; Bülters, M.; Morosov, K.; Bergmann, R. B.

Proc. 4th International Conference on Nanomanufacturing (nanoMan2014) 08.-10.07.2014 Bremen (CD-Rom)

Three dimensional fabrication of optical waveguiding elements for on-chip integration

Parsi Sreenivas, V.; Bülters, M. Schröder, M.; Bergmann, R. B.

Proc. SPIE Vol. 9130, Micro-Optics 2014, eds.: H.Thienpont, J. Mohr, H. Zappe, H. Nakajima. SPIE Bellingham WA (2014) 91300M1-7

Improving the Generic Camera Calibration technique by extended model of calibration display

Reh, T.; Li, Wansong; Burke, J.; Bergmann, R.B.

J. Europ. Opt. Soc. Rap. Public 9 (2014) 14044-1-4

Axially distributed sensing with a monoscopic imaging lens for single-shot distance measurements

Sandner, M.; Kolenović, E.; Klattenhoff, R.; Kolenović, E.; Elandaloussi, F.; v. Kopylow, C.; Bergmann, R. B.

Applied Optics 53 (2014) 5078 – 5083

Fabrication of 3d-microstructures for calibration of a holographic metrology system

Schröder, M.; Huferath-von Luepke, S.; Bülters, M.; Bergmann, R. B.

Proc. 4th International Conference on Nanomanufacturing (nanoMan2014) 08.-10.07.2014 Bremen (CD-Rom)

Dimensional Quality Inspection of Metallic Micro Components in Micro Bulk Manufacturing

Weimer, D.; Huferath-v. Lüpke, S.; Tausendfreund, A.; Lübke, K.; Falldorf, C.; Lütjen, M.; von Freyberg, A.; Bergmann, R B.; Goch, G.; Scholz-Reiter, B.

Advanced Materials Research Vol. 1018. TransTechn Publications Switzerland (2014) 493-500

A Comparison of in-situ Measuring Systems within Micro Cold Forming

Weimer, D., Huferath-von Lüpke, S., Falldorf, C., Lütjen, M., Tausendfreund, A., Kreis, Th., von Freyberg, A., Bergmann, R.B., Goch, G., Scholz-Reiter, B.

Proc. 4th International Conference on Nanomanufacturing (nanoMan2014) 8 – 10 July, 2014, Bremen (CD-Rom)

2013

Phase retrieval using constrains derived from the Helmholtz equation

Agour, M.; Kolenovic, E.; Falldorf, C.; v. Kopylow, C.; Jüptner, W.; Bergmann, R.B.

Computational Optical Sensing and Imaging (COSI-2013); OSA Technical Digest, Optial Society of America (2013) CTu3C.3

Investigation of composite materials using SLM-based phase retrieval   Direct link

Agour, M.; Falldorf, C.; Bergmann, R. B.

Optics Letters Vol. 38 (2013) 2203-2205

Advanced optical metrology for quality control (invited talk)

Bergmann, R. B.

Lasers in Manufacturing (LIM 2013), München (13.05.2013)

Qualifying parabolic mirrors with deflectometry    Direct link

Burke, J.; Li, W.; Heimsath, A.; v. Kopylow, C.; Bergmann, R.B.

J. Europ. Opt. Soc. Rap. Public 8 (2013) 13014-1-6

Wave field sensing by means of computational shear interferometry    Direct link

Falldorf, C.; v. Kopylow, C.; Bergmann, R. B.

J. Optical Society of America A. 30 (2013) 1905-1912

Computational shear interferometry for digital holography

Falldorf, C.; Bergmann, R. B.

SPIE Newsroom (2013) nur online

Novel trends in optical non-destructive testing methods    Direct link

Huke, P., Klattenhoff, R.; v. Kopylow, C. Bergmann, R. B.

J. Europ. Opt. Soc. Rap. Public, 8, 13043 (2013) 1-7

Nondestructive testing in an automated process chain for mass manufacturing of fiber reinforced thermoplastic components

Kalms, M.; Hellmers, S.; v. Kopylow, C.; Bergmann, R. B.,

Proc. SPIE Vol. XXXX Conference on Nondestructive Characterization for Composite Materials, Aerospace, Engineering, Civil Infrastructure, and Homeland Security VI, eds.: T Y. Yu, A. L. Gyekenyesi, P. J. Shull, A. A. Diaz, H. F. Wu. SPIE Bellingham (2013) 869429-1-9

Least-square based inverse reconstruction of in-line digital holograms

Kamau, E. N.; Burns, N.; Falldorf, C.; v. Kopylow, C.; Watson, J; Bergmann, R. B.

J. Optics 15 (2013) 075716

A new approach to dynamic wave field synthesis using computer generated volume holograms

Kamau, E. N., Falldorf, C., Bergmann, R. B.

Information Optics WIO (2013) 12th Workshop on. IEEE Xplore Tenerife/Spain (2013)1-3 (online)

Digital holographic system for the imaging and analysis of living marine plankton interrelational behavior

Kamau, E.N. ; Huke, P.; Bergmann, R. B.

3rd EOS Topical Meeting (on Blue Photonics – Optics in the Sea (2013) o.S.

Non-equilibrium Grain Size Distribution with Generalized Growth and Nucleation Rates

Lokovic, K. S.; Bergmann, R. B.; Bill, A.

J. Mater. Res., 28 (2013) 1407-1412

Vision ray camera calibration for small field of view

Reh, T; Li, W; Gesierich, A; Bergmann, R. B.

DGaO-Proceedings 2013 (online)

Areal absolute form measurement of optical surfaces using phase measuring deflectometry and shearing interferometry

Sandner, M.; Falldorf, C.; Simic, A.; Burke, J.; Bergmann, R. B.

Proc. 6th High Level Expert Meeting on Asphere Metrology, Braunschweig (2013) (CD)

2012

Misalignment compensation in spatial light modulator based optical filtering techniques

Agour, M.; Falldorf, C.; v. Koyplow, C.; Bergmann, R. B.

EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Design of diffractive optical elements for multiple wavelength image formation by gradient-based methods

Dankwart, C.; Falldorf, C.; v. Kopylow, C.; Bergmann, R.B.

EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Three dimensional optical components on IC surfaces for on-chip communication

Bülters, M.; Schröder, M.; Bergmann, R. B.

EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Reduction of speckle noise in multi wavelength contouring     Direct link

Falldorf, C.; Huferath-von Luepke, S.; v. Kopylow, C.; Bergmann, R. B.

Applied Optics 51, 8211-8215 (2012)

Holographic imaging utilizing pulsed ultra violet lasers and diamond-turned diffractive optical elements

Kibben, S.; Koerdt, M.; Dankwart, C.; Bergmann, R. B.; Vollertsen, F.

EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Non-destructive testing of carbon reinforced plastics by means of phase retrieval

Agour, M.; Falldorf, C.; v. Kopylow, C.; Bergmann, R. B.

Proc. SPIE Vol. XXXX, V International Conference on Speckle Metrology (Speckle 2012), eds.: A. F.Doval, C. Trillo, J. C. Lopez-Vazquez. SPIE Bellingham (2012) 841318-1-5

A fast and robust approach to phase shift registration from randomly phase shifted interferograms

Hildebrand, A.; Falldorf, C.; v. Kopylow, C.; Bergmann, R. B.

Proc. SPIE Vol. 8413. SPIE Bellingham (2012) 84130R

Design and simulation of three-dimensional optical polymer waveguide devices for photonic on-chip application

Schröder, M.; Bülters, M.; Bergmann, R. B.

EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Non-linear optimization for the reconstruction of wavefronts from gradient data

Falldorf, C.; Li, W.; v. Kopylow, C.; Bergmann, R. B.;

EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Comparative digital holographic microscope for wear detection at micro deep drawing tools

Huferath-von Lüpke, S., Zuch, U., Huke, P., v. Kopylow, C., Bergmann, R. B.

EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Optical non-destructive testing methods

Huke, P., v. Kopylow, C. Bergmann, R. B.

EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Laser-generated ultrasound with liquid crystal on silicon (LCoS) technology in the thermoelastic regime

Kalms, M.; Hellmers, S.; Bergmann, R. B.

Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security (2012) eds.: A. L. Gyekenyesi, T.-Y. Yu, P. J. Shull, A. A. Diaz, H. F. Wu. SPIE Bellingham/Washington (2012) 83470N1-9

Point Source Based Model for the Inverse Numerical Reconstruction of Digital Holograms

Kamau, E. N.; Wang, N.; Falldorf, C.; v. Kopylow, C.; Bergmann, R. B.

EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Qualifying parabolic mirrors with deflectometry

Li, W.; Heimsath, A.; Burke, J.; v. Kopylow, C.; Bergmann, R. B.

EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Microsized subsurface modification of mono-crystalline silicon via non-linear absorption    Direct link

Parsi Sreenivas, V. V., Bülters, M., Bergmann, R. B.

J. Europ. Opt. Soc. Rap. Public 7 (2012) 12035-1-5

Subsurface modification in mono-crystalline silicon by multiphoton processes – analytical model and first results

Parsi Sreenivas, V. V., Bülters, M., Bergmann, R. B.

EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Messen und Prüfen mit Licht

Sandner, M.; Burke, J.; v. Kopylow, C.; Bergmann, R. B.

wt Werkstattstechnik online, 11/12 (2012) 777-782

Novel concept for three-dimensional polymer waveguides for Optical on-Chip Interconnects    Direct link

Schröder, M.; Bülters, M.; v. Kopylow, C.; Bergmann, R. B.

J. Europ. Opt. Soc. Rap. Public 7 (2012) 12027-1-4

Wear recording at micro deep drawing tools with comparative digital holography    Direct link

Huferath-von Lüpke, S., Huke, P., v. Kopylow, C., Bergmann, R.B.

J. Europ. Opt. Soc. Rap. Public 7 (2012) 12041-1-7

Phase Retrieval for Optical Inspection of Technical Components

Falldorf, C.; Agour, M.; v. Kopylow, C.; Bergmann, R. B.

J. Opt. 14 (2012) 065701

2011

Wear recording at micro deep drawing tools with comparative digital holography

S. Huferath-von Lüpke, P. Huke, C. von Kopylow, Ralf B. Bergmann,

Proc. 1st EOS Topical Meeting on Micro- and Nano-Optoelectronic systems, 7.-9.12.2011, Bremen (CD-ROM), ISBN 978-3-00-033711-6 (2011)

Novel concept for three-dimensional polymer waveguides

M. Schröder, V. V. Parsi Sreenivas, C. von Kopylow, Ralf B. Bergmann

Proc.  1st EOS Topical Meeting on Micro- and Nano-Optoelectronic systems, 7.-9.12.2011, Bremen (CD-ROM), ISBN 978-3-00-033711-6 (2011)

Novel three-dimensional Polymer Waveguides for Optical on-Chip Interconnects

M. Bülters, M. Schröder, C. von Kopylow, Ralf B. Bergmann,

Proc. 1st EOS Topical Meeting on Micro- and Nano-Optoelectronic systems, 7.-9.12.2011, Bremen (CD-ROM), ISBN 978-3-00-033711-6 (2011)

Nanosized subsurface modification of mono-crystalline Silicon via non-linear absorbtion

V. V. Parsi Sreenivas, M. Bülters, C. von Kopylow, Ralf B. Bergmann

Proc. 1st EOS Topical Meeting on Micro- and Nano-Optoelectronic systems, 7.-9.12.2011, Bremen (CD-ROM), ISBN 978-3-00-033711-6 (2011)

Automated compensation of misalignment in phase retrieval based on a spatial light modulator    Direct link

M. Agour, C. Falldorf, C. von Kopylow, Ralf B. Bergmann

Applied Optics 50, 4779-4787 (2011)

The effect of misalignment in phase retrieval based on a spatial light modulator

M. Agour, C. Falldorf, C. von Kopylow, Ralf B. Bergmann

Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80820M (26 May 2011); doi: 10.1117/12.889200; https://doi.org/10.1117/12.889200

Schnelle 3D-Formerfassung von Mikrotiefziehbauteilen mittels digitaler Holografie

N. Wang, C. von Kopylow, C. Falldorf, Ralf B. Bergmann

Photonik 4, 40-42 (2011)

Assessment of digital holography for 3D-shape measurement of micro deep drawing parts in comparison to confocal microscopy

N. Wang, C. Falldorf, C. von Kopylow and Ralf B. Bergmann,

MEMS and Nanotechnology, Vol. 4: Proceedings of the 2011 Annual Conference

Proc. Society for Experimental Mechanics (SEM), Ed.: Tom Proulx, Springer, Berlin (2011)

Development of the grain size distribution during the crystallization of an amorphous solid

A. Bill, Ralf B. Bergmann

MRS Proceedings, 1308, Mrsf10-1308-dd03-01. doi:10.1557/opl.2011.506

Contactless defect detection using optical methods for non destructive testing NdT

Ph. Huke, O. Focke, C. Falldorf, C. von Kopylow, Ralf B. Bergmann, Proceedings of the 2nd Symposium on NDT in Aerospace 2010 (CD-ROM), (2011)

2010

Resolution enhancement by time-multiplexed acquisition of sub-pixel shifted images employing a spatial light modulator

A. Hildebrand, C. Falldorf, C. von Kopylow, Ralf B. Bergmann,

Proc. International Symposium on Optomechatronic Technologies (ISOT 2010), eds.: F. Janabi-Sharifi and J. Kofman, IEEE (2010), pp. 1-6, DOI: 10.1109/ISOT.2010.5687353 (CD-ROM)

Measurement of thermally induced deformations by means of phase retrieval

C. Falldorf, M. Agour, C. von Kopylow, Ralf B. Bergmann, Proceedings International Symposium on Optomechatronic Technologies (ISOT 2010), eds.: F. Janabi-Sharifi and J. Kofman, IEEE (2010), pp. 1-5, DOI: 10.1109/ISOT.2010.5687376 (CD-ROM)

Liquid crystal spatial light modulators in optical metrology (Invited paper)

C. Falldorf, C. von Kopylow, Ralf B. Bergmann

Invited Paper, Information Optics (WIO), 2010 9th Euro-American Workshop on Information Optics, Helsinki, eds.: T. J. Naughton, B. Javidi, IEEE (2010), pp. 1-3, DOI: 10.1109/WIO.2010.5582527 (CD-ROM)

Vision ray calibration for the quantitative geometric description of general imaging and projection optics in metrology    Direct link

Th. Bothe, W. Li, M. Schulte, C. von Kopylow, R. B. Bergmann, W. P. O. Jüptner

Applied Optics 49, pp 5851-5860 (2010)

Optical metrology and optical non-destructive testing from the perspective of object characteristics (Invited paper)

Ralf B. Bergmann, T. Bothe, C. Falldorf, P. Huke, M. Kalms, C. von Kopylow

Proc. SPIE Vol. 7791, Interferometry XV: Applications, 1-15, Bellingham, WA., USA (2010)

Grain size distribution in crystallization processes with anisotropic growth rate

Andreas Bill, K. S. Lokovic, Ralf B. Bergmann

MRS Spring Meeting, Symposium A, Vol. 1245 (2010), 1245-A16-07 (online)

Time evolution of the grain size distributions in random nucleation and growth crystallization processes

Anthony V. Teran, Andreas Bill, Ralf B. Bergmann.

Physical Review B 81(2010) 075319-1-19

Design of an optical system for phase retrieval based on a spatial light modulator

C. Falldorf, M. Agour, C. von Kopylow, Ralf B. Bergmann

in: Proceedings on „Advanced Phase Measurement Methods in Optics and Imaging“, Locarno, Switzerland (2010), p. 259-264

Digital alignment of a reconstructed hologram with an object for measurement of deterioration of tools

S. Huferath-von Lüpke, T. Baumbach, E. Kolenovic, C. Falldorf, C. v. Kopylow, Ralf B. Bergmann

in: Proceedings 36th Internat. MATADOR Conference 2010, eds.: S. Hinduja, L. Li, Springer Verlag London (2010), p. 331-334

Modeling of the optical behavior of diamond turned holograms

C. Dankwart, C. Falldorf, C. von Kopylow, Ralf B. Bergmann

Proc. EOS Topial Meeting on Diffractive Optics 2010-EOS 2010 (CD-ROM)

Phase retrieval by means of a spatial light modulator in the fourier domain of an imaging system    Direct link

C. Falldorf, M. Agour, C. von Kopylow, Ralf B. Bergmann

Applied Optics 49 (2010), p. 1826-1830

Design of a diamond turned hologram incorporating properties of the fabrication process    Direct link

C. Dankwart, C. Falldorf, R. Gläbe, B. Lünemann, C. von Kopylow, Ralf B. Bergmann

Applied Optics 49 (2010), 4949-4955

2009

Measurement of Optical Components

Ralf B. Bergmann, Th. Bothe, C. Falldorf, C. von Kopylow

Proc. Internat. Molded Optics Conference 2009 (iMOC 2009)

Holographic projection based on Diamond Turned Diffractive Optical Elements    Direct link

C. Falldorf, C. Dankwart, R. Gläbe, B. Lünemann, C. von Kopylow, Ralf B. Bergmann

Applied Optics 48 (2009), 5782-5785

The Fringe Reflection Technique for Lens Inspection and Specular Freeform Measurement

T. Bothe, W. Li, C. von Kopylow, Ralf B. Bergmann

MAFO Ophthalmic Labs & Industry 5 (2009), p. 38-42

Lateral Shearing Interferometer based on a Spatial Light Modulator in the Fourier Plane

C. Falldorf, R. Klattenhoff, A. Gesierich, C. von Kopylow, R. B. Bergmann

Proc. FRINGE 2009 – The 6th International Workshop on Advanced Optical Metrology, p. 93 – 98 (2009)

2008

On the origin of logarithmic-normal distributions: An analytical derivation, and its application to nucleation and growth processes

Ralf B. Bergmann, Andreas Bill

J. Crystal Growth 310/13, 3135-3138 (2008)

On the logarithmic-normal distribution in nucleation and growth processes

Andreas Bill, Anthony Teran, Ralf B. Bergmann

APS-Spring Meeting 2008, Abstract only

2006

Non-Destructive Testing in the Automotive Supply Industry – Requirements, Trends and Examples Using X-ray CT“ (invited paper)

Ralf B. Bergmann, Florian T. Bessler and Walter Bauer

in: 9th Europ. Conf. for Non-Destructive Testing, Berlin, September 25 – 29, 2006, DGZFP Proceedings BB 103-CD, Th.1.6.1

2004

Computer tomography for non-destructive testing in the automotive industry

Walter Bauer, Florian T. Bessler, Erich Zabler and Ralf B. Bergmann

in: SPIE Conference, Denver, USA, August 2004, Session 12, Materials Research II, Talk No. 5535-50

2003

Röntgen-Computertomographie in der industriellen Fertigung – Anwendungen und Entwicklungsziele

E. Zabler, M. Rosenberger-Koch und R. B. Bergmann

in: Jahrestagung der Dt. Gesellschaft für zerstörungsfreie Prüfung (DGZFP), Tagungsband auf CD-ROM (DGZFP, 2003), V 17

Low-temperature epitaxy on polycrystalline silicon substrates

T. A. Wagner, L. Oberbeck, R. B. Bergmann, M. Nerding, H. P. Strunk and J. H. Werner

Solid State Phenomena 93, 121 (2003)

Single to polycrystalline transition in silicon growth by ion assisted deposition at low temperatures

M. Nerding, L. Oberbeck, T. A. Wagner, R. B. Bergmann and H. P. Strunk

J. Applied Physics 93, 2570 (2003)

2002

„Growth, characterization and electronic applications of Si-based thin films“

Volume Editor: Ralf B. Bergmann (Research Signpost, Trivandrum, India, 2002).

Contributions:

„Thin film transistors for flexible electronics“ by S. Wagner, H. Gleskova, I. Chun Cheng and M. Wu;

„Nucleation and growth dynamics in polycrystalline Si (SiGe) thin films formation“ by H. Kumomi;

„Laser crystallization of Si and SiGe films“ by J. R. Köhler;

„Solid phase crystallization of Si and Ge:“ by H. Atwater and C. M. Chen;

„Zone melting recrystallization of Si films for solar cells“ by T. Ishihara;

„Thin film Si-based opto¬electronics“ by S. Pizzini and S. Binetti;

„Low temperature epitaxial growth of Si and SiGe films“ by L. Oberbeck;

„High temperature deposition and epitaxy of Si and SiGe“ by A. Slaoui, J. Poortmans and M. Caymax;

„Transfer of monocrystalline Si films for thin film solar cells“ K. J. Weber, M. Stocks, A. W. Blakers and M. McCann;

„Transfer of monocrystalline Si films for silicon on insulator devices“ N. Sato, K. Ohmi, and T. Yonehara;

„Thin semiconductor films: Future trends“ by H.-J. Queisser

Advances in Monocrystalline Si Thin Film Solar Cells by Layer Transfer

R. B. Bergmann, C. Berge, T. J. Rinke, J. Schmidt, and J. H. Werner

Solar Energy Materials & Solar Cells 74, 213 (2002)

The Future of Crystalline Silicon Films on Foreign Substrates

R. B. Bergmann and J. H. Werner

Thin Solid Films 403-404, 162-169 (2002)

Optimization and characterization of amorphous/crystalline silicon heterojunction solar cells

N. Jensen, R. M. Hausner, R. B. Bergmann, J. H. Werner, and U. Rau

Prog. Photovolt. Res. & Appl. 10, 1-13 (2002)

Low temperature epitaxial Silicon films deposited by ion-assisted deposition

T. A. Wagner, L. Oberbeck, and R. B. Bergmann

Mat. Sci. Eng. B 89, 319 (2002)

Monocrystalline Si Thin Film Solar Cells by Layer Transfer

C. Berge, R. B. Bergmann, T. J. Rinke, and J. H. Werner

Proc. 17th Europ. Photov. Solar Energy Conf., B. McNelis, W. Palz, H. A. Ossenbrink, and P. Helm, Eds. (WIP Munich, Germany, 2002), p. 1277

Application of plasma silicon nitride to crystalline thin-film silicon solar cells

J. Schmidt, L. Oberbeck, T. J. Rinke, C. Berge, R. B. Bergmann

in Proc. 17th Europ. Photov. Solar Energy Conf., B. McNelis, W. Palz, H. A. Ossenbrink, and P. Helm, Eds. (WIP Munich, Germany, 2002), p. 1351

2001

High rate deposition of epitaxial layers for efficient low temperature thin film epitaxial silicon solar cells

L. Oberbeck, J. Schmidt, T. Wagner, and R. Bergmann

Prog. Photovolt. Res. Appl. 9, 333 (2001)

Orientation-Dependence of Low Temperature Epitaxiasl Silicon Growth

T. A. Wagner, L. Oberbeck, M. Nerding, H. P. Strunk and R. B. Bergmann

Mat. Res. Soc. Symp. Proc. 664, A22.3 (2001)

Crystalline Silicon Thin Film Solar Cells

Jürgen H. Werner and Ralf B. Bergmann

in Techn. Digest 12th Int. Photovolt. Science and Engineering Conf. (Kyung Hee Information Printing, Seoul, 2001), p. 69

Monocrystalline Si Films from Transfer Processes for Thin Film Devices

Ralf B. Bergmann, Christopher Berge, Titus J. Rinke, and Jürgen H. Werner

Mat. Res. Soc. Symp. Proc. 685E, D2.1 (2001)

Intra grain defects – limiting factor for low temperature polycrystalline silicon films

T. A. Wagner, L. Oberbeck, R. B. Bergmann, J. H. Werner

Solid State Phenom. 80-81, 95 (2001)

High-quality and low-temperature epitaxial Si films deposited at very high deposition rate

R. B. Bergmann, L. Oberbeck, and T. A. Wagner

J. Crystal Growth 225, 335 (2001)

From polycrystalline to single crystalline silicon on glass

J. H. Werner, R. Dassow, T. J. Rinke, J. R. Köhler, and R. B. Bergmann

Thin Solid Films 383, 95(2001)

Thin film solar cells on glass based on the transfer of monocrystalline Si films

R. B. Bergmann, T. J. Rinke, T. A. Wagner, and J. H. Werner

Solar Energy Materials & Solar Cells 65, 355 (2001)

2000

Ion-assisted deposition of silicon epitaxial films with high deposition rate using low energy silicon ions

Lars Oberbeck, Thomas A. Wagner, and Ralf B. Bergmann

Mat. Res. Soc Symp. Proc. 609, A7.1.1 (2000)

Ions allow silicon growth to keep its cool

L. Oberbeck and R. B. Bergmann

Vacuum Solutions 18, 31 (2000)

Efficient thin film solar cells by transfer of monocrystalline Si layers

T. J. Rinke, R. B. Bergmann and J. H. Werner

in: Proc. 16th European Photovoltais Solar Energy Conference, Eds.: H. Scheer, B. McNelis, W. Palz, H. A. Ossenbrink and P. Helm (James & James Science Publishers Ltd., London, 2000), p. 1128

Perspectives of crystalline Si thin film solar cells: A new era of thin monocrystalline Si-films?

R. B. Bergmann and T. R. Rinke

Prog. Photovolt.: Res. Appl. 8, 451 (2000)

Solarzellen und Mikrochips von morgen

R. B. Bergmann, T. J. Rinke and J. H. Werner, Physikalische Blätter, Vol. 56, Nr. 9, 51 (2000)

Monocrystalline Si thin film solar cells: A new era for thin film photovoltaics?

R. B. Bergmann, T. J. Rinke, and J. H. Werner,

in 10th Workshop on Crystalline Silicon Solar Cell Materials and Processes, Ed. B. L. Sopori (NREL, Golden Colorado, 2000), p. 125

Electronic properties of silicon epitaxial layers deposited by ion-assisted deposition at low temperatures

L. Oberbeck and R. B. Bergmann

J. Appl. Phys. 88, 3015 (2000)

Structure and properties of quasi-monocrystalline Si thin films

T. J. Rinke, R. B. Bergmann, and J. H. Werner

Mat. Res. Soc. Symp. Proc. 558, 251 (2000)

Recombination mechanisms in amorphous silicon/crystalline silicon heterojunction solar cells

N. Jensen, U. Rau, R. M. Hausner, S. Uppal, L. Oberbeck, R. B. Bergmann and J. H. Werner

J. Appl. Phys. 87, 2639 (2000)

Low-temperature processing of crystalline Si films on glass for electronic applications

R. B. Bergmann, T. J. Rinke, L. Oberbeck, and R. Dassow

in: Perspectives, Science and Technologies for Novel Silicon on Insulator Devices, Eds.: P. L. F. Hemment, V. S. Lysenko and A. N. Nazarov, NATO Science Series 3. High Technology – Vol. 73 (Kluwer Academic Publishers, Dordrecht, 2000), p. 109

1999

Perspectives of Crystalline Silicon Thin Film Solar Cells

J. H. Werner and R. B. Bergmann

in: Technicals Digest 11th Intern. Photov. Science and Engin. Conf., Sapporo (Tokyo University of Agriculture & Technology, Tokyo, 1999), p. 923

Crystalline Si Films on Foreign Substrates for Electronic Applications

R. B. Bergmann

in: Recent Res. Devel. Crystal Growth Res. 1, 241 (1999)

Material Aspects of Crystalline Silicon Thin Film Solar Cells on Glass

R. B. Bergmann

in: 9th Workshop on Crystalline Silicon Solar Cell Materials and Processes (NREL, Golden, Colorado, 1999), p. 94

Thin film solar cells on glass by transfer of monocrystalline Si films

R. B. Bergmann, T. J. Rinke, R. M. Hausner, M. Grauvogl, M. Vetter, and J. H. Werner

International Journal of Photoenergy 1, 83 (1999)

Crystalline Si thin film solar cells: A review

R. B. Bergmann

Applied Physics A 69, 187 (1999)

Quasi-monocrystalline silicon for thin film devices

T. J. Rinke, R. B. Bergmann, and J. H. Werner

Applied Physics A 68, 705 (1999)

Laser-crystallized polycrystalline silicon on glass for photovoltaic applications

R. Dassow, J. R. Köhler, M. Grauvogl, R. B. Bergmann, and J. H. Werner

Solid State Phenomena 67-68, 193 (1999)

Low-temperature silicon-epitaxy by ion-assisted deposition

L. Oberbeck, R. B. Bergmann, N. Jensen, S. Oelting, and J. H. Werner

Solid State Phenomena 67-68, 459 (1999)

Heterojunctions for polycrystalline silicon solar cells

R. M. Hausner, N. Jensen, R. B. Bergmann, U. Rau, and J. H. Werner

Solid State Phenomena 67-68, 571 (1999)

Ultrathin quasi-monocrystalline silicon films for electronic devices

T. J. Rinke, R. B. Bergmann, R. Brüggemann, and J. H. Werner

Solid State Phenomena 67-68, 229 (1999)

Large-grained polycrystalline silicon on glass by copper vapor laser annealing

J. R. Köhler, R. Dassow, R. B. Bergmann, J. Krinke, H. P. Strunk, and J. H. Werner

Thin Solid Films 337, 129 (1999)

1998

High rate, low-temperature deposition of crystalline silicon films for thin film solar cells on glass

R. B. Bergmann, R. M. Hausner, N. Jensen, M. Grauvogl, L. Oberbeck, T. Rinke, M. B. Schubert, Ch. Zaczek, R. Dassow, J. R. Köhler, U. Rau, S. Oelting, J. Krinke, H. P. Strunk, and J. H. Werner

in: Proc. 2nd World Conference on Photovoltaic Energy Conversion, eds: J. Schmid, H. A. Ossenbrink, P. Helm, H. Ehmann, E. D. Dunlop (European Commission Ispra, 1998), p. 1260

Light trapping and amorphous/crystalline heterojunctions for silicon thin film solar cells on glass

R. M. Hausner, R. B. Bergmann and J. H. Werner

in: Proc. 2nd World Conference on Photovoltaic Energy Conversion, eds: J. Schmid, H. A. Ossenbrink, P. Helm, H. Ehmann, E. D. Dunlop (European Commission Ispra, 1998), p. 1754

High resolution ebic imaging of polycrystalline silicon solar cells

A. B. Sproul, T. Puzzer, and R. B. Bergmann

in: Proc. 2nd World Conference on Photovoltaic Energy Conversion, eds: J. Schmid, H. A. Ossenbrink, P. Helm, H. Ehmann, E. D. Dunlop (European Commission Ispra, 1998), p. 1355

Low temperature Si-epitaxy with high deposition rate using ion assisted deposition

R. B. Bergmann, C. Zaczek, N. Jensen, S. Oelting, and J. H. Werner

Applied Physics Letters 72, 2996 (1998)

Growth mechanisms in laser crystallization and laser interference crystallization

G. Aichmayr, D. Toet, M. Mulato, P. V. Santos, A. Spangenberg, and R. B. Bergmann

J. Non-Crystalline Solids 227/230, 921 (1998)

Nucleation and Growth of Crystalline Silicon Films on Glass for Solar Cells

R. B. Bergmann, J. Köhler, R. Dassow, C. Zaczek and J. H. Werner

Physica Status Solidi (a) 166, 587 (1998)

Non-coarsening origin of log-normal size distributions during crystallization of amorphous films

R. B. Bergmann, F. G. Shi and J. Krinke

Physical Review Letters 80, 1011 (1998)

Formation of Semiconductors with Log-Normal Grain Size Distributions

R. B. Bergmann, F. G. Shi, H. J. Queisser and J. Krinke

Applied Surface Science 123/124, 376 (1998)

High-efficiency drift-field thin-film silicon solar cells grown on electronically inactive substrates

G. F. Zheng, W. Zhang, Z. Shi, D. Thorp, R. B. Bergmann, M. A. Green

Solar Energy Materials and Solar Cells 51, 95 (1998)

1997

Transport analysis for polycrystalline silicon solar cells on glass substrates

R. Brendel, R. B. Bergmann, B. Fischer, J. Krinke, R. Plieninger, U. Rau, J. Reiß, H. P. Strunk, H. Wanka, and J. H. Werner

in: Proc. 26th Photov. Specialists Conf., (IEEE, Picataway, 1997), p. 635

Zone melt recrystallization of silicon films on glass

R. B. Bergmann, C. Hebling, and J. H. Werner

in: Proc. 14th Europ. Photovoltaic Solar Energy Conf., Hrsg. H. A. Ossenbrink, P. Helm, and H. Ehmann (Stephens & Assoc., Bedford, 1997), p. 1464

Polycrystalline Silicon Films on Glass for Solar Cells by Ion-Assisted Deposition

J. Kühnle, R. B. Bergmann, S. Oelting, J. Krinke, H. P. Strunk, J. H. Werner

in: Proc. 14th Europ. Photovoltaic Solar Energy Conf., Hrsg. H. A. Ossenbrink, P. Helm, and H. Ehmann, (Stephens & Assoc., Bedford, 1997), p. 1022

Optical and structural characterization of silicon microstructures fabricated by laser interference crystallization

D. Toet, G. Aichmayr, M. Mulato, P. V. Santos, A. Spangenberg and R. B. Bergmann

Mat. Res. Soc. Symp. Proc. 467, 337 (1997)

Deposition and characterization of polycrystalline silicon films for thin film solar cells on glass substrates“

R. B. Bergmann, J. Krinke, H. P. Strunk, and J. H. Werner

Mat. Res. Soc. Symp. Proc. 467, 352 (1997)

Crystalline silicon films on a novel high temperature glass for applications in microelectronics and photovoltaics

R. B. Bergmann, J. G. Darrant, A. R. Hyde, and J. H. Werner,

J. Non-Cryst. Solids 218, 388 (1997)

Fabrication of single crystalline SiC layer on high temperature glass

Q.-Y. Tong, T.-H. Lee, P. Werner and U. Gösele, R. B. Bergmann and J. H. Werner

J. Electrochem. Soc. 144, L111 (1997)

Large grained polycrystalline silicon films by solid phase crystallization of phosphorus doped amorphous silicon

R. B. Bergmann and J. Krinke

J. Crystal Growth 177, 191 (1997)

Solid phase crystallized Si films on glass substrates for thin film solar cells

R. B. Bergmann, G. Oswald, M. Albrecht and V. Gross

Solar Energy Materials and Solar Cells 46, 147 (1997)

Ultrathin crystalline silicon solar cells on glass substrates

R. Brendel, R.B. Bergmann, P. Lölgen, M. Wolf, and J.H. Werner

Appl. Phys. Letters 70, 390 (1997)

Growth of polycrystalline silicon films on glass by high temperature chemical vapor deposition

R. B. Bergmann, R. Brendel, M. Wolf, P. Lölgen, J. Krinke, H.P. Strunk and J.H. Werner

Semiconductor Science and Technology 12, 224 (1997)

Role of critical grain size of nuclei for homoepitaxy of polycrystalline Si

J. Kühnle, R. B. Bergmann, and J.H. Werner

J. Crystal Growth 173, 62 (1997)

Large area polycrystalline silicon thin films grown by laser-induced nucleation and solid phase crystallization

D. Toet, B. Koopmans, R.B. Bergmann, B. Richards, P.V. Santos, M. Albrecht, and J. Krinke

Thin Solid Films 296, 49 (1997)

1996

Growth of polycrystalline silicon on glass by selective laser-induced nucleation

D. Toet, B. Koopmans, P. V. Santos, R.B. Bergmann and B. Richards

Appl. Phys. Letters 69, 3719 (1996)

Crystalline silicon films by chemical vapor deposition on glass for thin film solar cells

R. B. Bergmann, R. Brendel, M. Wolf, P. Lölgen, J.H. Werner, J. Krinke, and H.P. Strunk

Proc. 25th IEEE PVSEC, (IEEE, Piscataway, 1996), p. 365

Comparison of vapor phase and liquid phase epitaxy for deposition of crystalline Si on glass

J. Kühnle, R.B. Bergmann, J. Krinke, and J.H. Werner

Mat. Res. Soc. Symp. Proc. 426, 111 (1996)

Growth of polycrystalline silicon using selective nucleation by laser interference crystallization

D. Toet, P.V. Santos, R. B. Bergmann, G. Aichmayr and M. Heintze

Proc. 23rd Internat. Conf. on the Physics of Semiconductors, Eds.: M. Scheffler and R. Zimmermann (World Scientifc, Singapore, 1996), p. 1123

Optical in-situ monitoring of solid phase crystallization of amorphous silicon

R. B. Bergmann

J. Crystal Growth 165, 341 (1996)

Silicon surface passivation by metal layers for low-temperature epitaxy

Jürgen Kühnle, Ralf Bergmann, Jürgen H. Werner, and Martin Albrecht

J. Crystal Growth 163, 470 (1996)

Polycrystalline silicon on glass substrates for thin film solar cells

R. Bergmann, G. Oswald, M. Albrecht, and J. H. Werner

Solid State Phenomena 51-52, 515 (1996)

The effects of solvent and dopant impurities on the performance of LPE silicon solar cells

Z. Shi, W. Zhang, G. F. Zheng, V. L. Chin, A. Stephens, M. A. Green and R. Bergmann

Solar Energy Materials and Solar Cells 41/42, 53 (1996)

1993-1995

The growth and properties of liquid phase epitaxial silicon in a forming gas ambient

Z. Shi, W. Zhang, G.F. Zheng, J. Kurianski, M.A. Green and R. Bergmann, J. Crystal Growth 151, 278 (1995)

Polycrystalline silicon for thin film solar cells

R. Bergmann, J. Kühnle, J.H. Werner, S. Oelting, M. Albrecht, H.P. Strunk, K. Herz and M. Powalla

in: Proc. 1st World Conf. on Photovoltaic Energy Conversion, (IEEE, Piscataway, 1994), p. 1398-1401

Thin film silicon solar cells by LPE and substrate thinning techniques

Z. Shi, G.F. Zheng, W. Zhang, S.J. Robinson, M.A. Green, and R. Bergmann

in: Proc. 12th European Photovoltaic Solar Energy Conference, Eds.: R. Hill, W. Palz, P. Helm (H.S. Stephens & Associates, Bedford, 1994), p. 1835

Opto-electronic characterisation of thin-film crystalline silicon solar cells grown from metal solutions

S.J. Robinson, G-F. Zheng, W. Zhang, Z. Shi, M.A. Green, and R. Bergmann

in: Proc. 12th European Photovoltaic Solar Energy Conference, Eds.: R. Hill, W. Palz, P. Helm (H.S. Stephens & Associates, Bedford, 1994), p. 1831

The challenge of crystalline thin film silicon solar cells

J.H. Werner, R. Bergmann, and R. Brendel

in: Festkörperprobleme / Advances in Solid State Physics Vol. 34, Ed: R. Helbig (Vieweg, Braunschweig, 1994), p. 115 – 146

Kristallzüchtung für die Photovoltaik – Forschung in Deutschland“ (Crystal Growth for Photovoltaics – Research in Germany)

R. Bergmann and J.H. Werner

Mitteilungsblatt der Deutschen Gesellschaft für Kristallwachstum und Kristallzüchtung Vol. 59 (German Society for Crystal Growth), May 1994, p.15

Solution growth of silicon on Al-Si coated quartz glass substrates

S.H. Lee, R. Bergmann, E. Bauser and H.J. Queisser

Materials Letters 19, 1 (1994)

Thin film silicon solar cells on glass by substrate thinning

G.F. Zheng, Z. Shi, R. Bergmann, X. Dai, S. Robinson, A. Wang, J. Kurianski and M.A. Green

Solar Energy Materials and Solar Cells 32, 129 (1994)

Silicon films incorporating a drift-field grown by liquid phase epitaxy for solar cell applications

R. Bergmann, S. Robinson, Z. Shi and J. Kurianski

Solar Energy Materials and Solar Cells 31, 447 (1993)

The role of hydrogen in silicon liquid phase epitaxy

R. Bergmann and J. Kurianski

Materials Letters 17, 137 (1993)

1988-1992

Investigation of epitaxial lateral overgrowth by x-ray topography

R. Köhler, B. Jenichen, E. Bauser and R. Bergmann

J. Appl. Phys. 72, 405 (1992)

High quality GexSi1-x by heteroepitaxial lateral overgrowth

P. O. Hansson, A. Gustafsson, M. Albrecht, R. Bergmann, H.P. Strunk, and E. Bauser

J. Crystal Growth 121, 790 (1992)

First MOS transistors on insulator by silicon saturated liquid solution epitaxy

R. P. Zingg, N. Nagel, R. Bergmann, E. Bauser, B. Höfflinger and H. .J. Queisser

IEEE Electron Device Letters 13, 294 (1992)

Selective liquid-phase epitaxy of silicon for microelectronics applications

N. Nagel, R. P. Zingg, R. Bergmann, and E. Bauser

in: Micro Systems Technologies ’92, Ed. H. Reichl (VDE-Verlag, Berlin, 1992), p. 135

MOS-transistors with epitaxial Si, laterally grown over SiO2 by liquid phase epitaxy

R. Bergmann, E. Czech, I. Silier, N. Nagel, E. Bauser, H. .J. Queisser, R. P. Zingg and B. Höfflinger

Appl. Phys. A 54, 103 (1992)

Epitaxial lateral overgrowth of silicon on SiO2 investigated by x-ray topography

B. Jenichen, R. Köhler, N. Nagel, R. Bergmann, and E. Bauser

in: Mechanisms of Heteroepitaxial Growth, Mat. Res. Soc. Symp. Vol. 263, Eds.: M.F. Chisholm, R. Hull, L.J. Schowalter, B.J. Garrison, (Mater. Res. Soc., Pittsburgh, 1992) p.215

Heteroepitaxial lateral overgrowth of GexSi1-x over SiO2/Si structures by liquid phase epitaxy

P.O. Hansson, R. Bergmann and E. Bauser

J. Crystal Growth 114, 573 (1991)

Dislocation generation in silicon grown laterally over SiO2 by liquid phase epitaxy

F. Banhart, R. Bergmann, F. Phillipp, and E. Bauser

Appl. Physics A 53, 317 (1991)

Model for defect-free epitaxial lateral overgrowth of Si over SiO2 by liquid phase epitaxy

R. Bergmann

J. Crystal Growth 110, 823 (1991)

Silicon layers grown over SiO2 by liquid phase epitaxy – an electron microscopical study

F. Banhart, F. Phillipp, R. Bergmann, E. Czech, M. Konuma, and E. Bauser

in: Proc. 12th Int. Congress for Electron Microscopy, Seattle WA, Vol.4, Eds.: L.D. Peachey, D.B. Williams, (San Francisco Press, San Francisco, 1990) p.566

Defect-free epitaxial lateral overgrowth of oxidized (111) Si by liquid phase epitaxy

R. Bergmann, E. Bauser and J. H. Werner

Appl. Phys. Lett. 57, 351 (1990)

Determination of recombination parameters in silicon solar cells using light induced transients

W. Warta, R. Bergmann, and B. Voss

in: Proc. 8th E.C. Photovoltaic Solar Energy Conference, Eds.: I. Solomon, B. Equer and P. Helm (Kluver Academic Publishers, Dordrecht, 1988) Vol.2, p.1416