Publikationen
Prof. Dr. rer. nat. RALF B. BERGMANN
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Recent invited talks
The coherence function for optical metrology – A new paradigm and the role of information theory and compressed sensing
Bergmann, R. B. , Falldorf, C., Garcia-Ortiz, A., Müller, A.F., Agour, M., Bockelmann, C.
SPIE Optical Metrology, Modeling Aspects in Optical Metrology IX, Munich, Germany (26.06.2023)
Optische In‐Prozess‐Messung: Konzepte für präzise, schnelle und robuste optische Messtechnik für komplexe Messsituationen
Bergmann, R. B.
13. Jenaer Lasertagung (03.11.2022)
7D-Metrologie: Die Kohärenzfunktion zur Lösung komplexer Probleme der optischen Messtechnik
Bergmann, R. B., Falldorf, C.
122. DGaO-Jahrestagung, Bremen (21.09.2021)
Computational optical metrology (Hauptvortrag):
Bergmann, R. B.; Falldorf, C.
118. DGaO-Jahrestagung, Dresden (07.06.2017)
Computational optical metrology (Keynote Speech):
Bergmann, R. B., Falldorf, C.; Klein, Th.; Agour, M., International Conference on Optical and Photonic Engineering (icOPEN 2016),
Chengdu, China (27.09.2016)
Optical metrology for micro-parts (Invited Talk):
Bergmann, R. B.; Agour, M.; Falldorf, C.
DSPE Optics and Optomechatronics Symposium, Delft (28.09.2015)
Precision optical metrology without lasers (Invited Talk):
Bergmann, R. B.; Burke, J.; Falldorf, C.
Proc. Of SPIE 9524, International Conference on Optical and Photonics Engineering (icOPEN 2015),
Singapore (15.04.2015)
Optical metrology on the micro and nano scale (Invited Talk):
Bergmann, R. B.; Burke, J.; Huferath-von Lüpke, S.; Falldorf, C., 4th International nanoManufacturing Conference (nanoMan 2014), Bremen (09.07.2014)
Nanophotonics in three dimensions: heading from microelectronics towards optical computing (Invited Talk):
Bergmann, R. B.; Bülters, M.; Garcia-Ortiz, A.; Gutowski, J.; Lang, W.
2nd International Conference on System-Integrated Intelligence (SystInt 2014) Bremen (03.07.2014)
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Books and chapters
Quality inspection and logistic quality assurance of micro technical manufacturing processes
Agour, M.; von Freyberg, A.; Staar, B.; Falldorf, C.; Fischer, A.; Lütjen, M.; Freitag, M.; Goch, G.; Bergmann, R. B.
In: Cold Micro Metal Forming, eds. F. Vollertsen, B. Kuhfuß, C. Thomy, S. Friedrich, P. Maaß, H.-W. Zoch
Springer Nature Switzerland AG, Cham/CH (2020) 256-274
Inspection of functional surfaces on micro components in the interior of cavities
Simic, M.; Staar, B.; Falldorf, C.; Lütjen, M.; Freitag, M.; Bergmann, R. B.
In: Cold Micro Metal Forming, eds. F. Vollertsen, B. Kuhfuß, C. Thomy, S. Friedrich, P. Maaß, H.-W. Zoch
Springer Nature Switzerland AG, Cham/CH (2020) 275-288
Optical Metrology
von Kopylow, C.; Bergmann, R. B.
in: Micro Metal Forming, F. Vollertsen (Ed.)
(Springer, Berlin, 2013), 392 – 404
Advanced methods for optical non-destructive testing
Bergmann, R. B.; Huke, P.
In: Optical Imaging and Metrology: Advanced Technologies. Eds.: W. Osten, N. Reingand,
Wiley-VCH Weinheim (2012) 393-412
Interferometrische Submikrometer-Messtechnik in der Automobilindustrie
Bergmann, R. B.; Drabarek, P.; Kallmann, U.; Schmidtke, B.; Bauer J.
In: Photonik – Grundlagen, Technologie und Anwendung. Hrsg. E. Hering, R. Martin,
Springer Verlag Berlin-Heidelberg (2006) 263-281
Methoden der zerstörungsfreien Prüfung
Bergmann, R. B.; Zabler, E.
In: Handbuch der Mess- und Automatisierungstechnik in der Produktion. Hrsg. H. J. Gevatter,
U. Grünhaupt, Springer-Verlag Heidelberg (2006) 364-410
Growth, characterization and electronic applications of Si-based thin films
Bergmann, R. B. (Editor)
Research Signpost Trivandrum (2002)
Crystalline Si films on foreign substrates for electronic applications
Bergmann, R. B.
In: Recent Res. Devel. Crystal Growth Res.,
Managing Editor: S. G. Pandalai, Transworld Research Network, Vol. 1 (1999) 241-256
The challenge of crystalline thin film silicon solar cells
Werner, J. H.; Bergmann, R. B.; Brendel, R.
In: Festkörperprobleme / Advances in Solid State Physics 34. Hrsg.: R. Helbig, Vieweg Braunschweig (1994) 115-146
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Publications
2024
Falldorf, C., Picart, P.; Furlong, C.; Almoro, P.:
Special Section Guest Editorial: Lensless Imaging in Optical Metrology
Opt. Eng. 63(11) 111801 (2024)
https://doi.org/10.1117/1.OE.63.11.111801
Müller, A. F.; Bergmann, R. B.; Falldorf, C.:
High resolution lensless microscopy based on Fresnel propagation
Opt. Eng. 63(11) 111805 (2024)
https://doi.org/10.1117/1.OE.63.11.111805
Müller, A. F.; Gutiérrez-Cañas Pazos, B.; Mitura, N.; Ehret, G.; Falldorf, C.; Bergmann, R. B.:
Calibrating multispot illumination for asphere metrology using shear-interferometry
Proc. SPIE 13241, Optical Metrology and Inspection for Industrial Applications XI, 132410N (2024)
https://doi.org/10.1117/12.3037594
Thiemicke, F.; Falldorf, C.; Bergmann, R.B.:
Fabrication of positionable free-standing microstructures for applications in near-field microscopy
Proc. of the 125. Jahrestagung der DGaO, Aachen (2024)
ISSN: 1614-8436 – urn:nbn:de:0287-2024-B013-4
Gutiérrez-Cañas Pazos, B.; Falldorf, C.; Bergmann, R. B.:
Characterization of form deviations on technical surfaces through structure function analysis
Proc. of the 125. Jahrestagung der DGaO, Aachen (2024)
ISSN1614-8436 – urn:nbn:de0287-2024A033-9
Mitura, N.; Müller, A. F.; Bergmann, R. B.; Falldorf, C.; Ehret, G.:
Der Einfluss der Wellenvektorunsicherheit auf die Rekonstruktion der Oberflächenform bei einer MArS-Messung
Proc. of the 125. Jahrestagung der DGaO, Aachen (2024)
ISSN1614-8436 – urn:nbn:de0287-2024A007-4
Agour M.; Thiemicke, F.; Müller, A. F. ;; Bergmann. R. B.; Falldorf, C.
Lensless multi-spectral holographic interferometry for optical inspection (2024)
Front. Photonics 5:1416347.
doi: 10.3389/fphot.2024.1416347
Sperling, Y.; Bergmann, R. B.:
Phase measuring deflectometry with monoscopic active display registration
Proc. SPIE 12997, Optics and Photonics for Advanced Dimensional Metrology III; 1299713 (2024)
https://doi.org/10.1117/12.3015111
Falldorf, C.; Müller, A. F.; Bergmann, R. B.:
Beyond lenses: unlocking the potential of digigal holography for optical inspection
In Proc. 7th International Conference on Optics, Photonics and Lasers (OPAL’2024) 15-17 May 2024, Palma de Mallorca, Spain
https://doi.org/10.13140/RG.2.2.20925.27360
Müller, A. F.; Bergmann, R. B.; Falldorf, C.:
Lensless microscopy using a virtual imaging approach
In Proc. 7th International Conference on Optics, Photonics and Lasers (OPAL’2024) 15-17 May 2024, Palma de Mallorca, Spain
https://doi.org/10.13140/RG.2.2.20925.27360
Müller, A. F.; Bergmann, R. B.; Falldorf, C.:
High resolution lensless microscopy based on fresnel propagation
Optical Engineering 63, 11, (2024) 111805
https://doi.org/10.1117/1.OE.63.11.111805
Agour, M.; Falldorf, C.; Bergmann, R. B.:
Lensless depth discrimination based on speckle contrast in holographic imaging
In Proc. 7th International Conference on Optics, Photonics and Lasers (OPAL’2024) 15-17 May 2024, Palma de Mallorca, Spain
http://dx.doi.org/10.13140/RG.2.2.20925.27360
Agour, M.; Falldorf, C.; Bergmann, R. B.:
Extended-aperture shape measurements using spatially partially coherent illumination (ExASPICE) Sensors, 24(10), 3072 (2024)
https://doi.org/10.3390/s24103072
Sperling, Y.; Bergmann, R. B.
Laser-tracker-based reference measurement for geometric calibration of phase-measuring deflectometry with active display registration
Journal of Sensors and Sensor Systems, Volume 13, S. 1 – 7 (2024)
https://doi.org/10.5194/jsss-13-1-2024
2023
Sperling, Y.; Bergmann, R. B.
Active Display Registration in Phase Measuring Deflectometry
Proc. of Sensor and Measurement Science International 2023 Conference, 49 – 50 (2023)
https://doi.org/10.5162/SMSI2023/A3.3
Falldorf, C.; Thiemicke, F.; Müller, A. F.; Agour, M.; Bergmann, R. B.
Flash-profilometry: fullfield lensless acquisition of spectral holograms for coherence scanning profilometry
Optics Express 31, 17 (2023) 27494
Bartsch, J.; Müller, S.; Mattulat, T.; Bergmann, R. B; Woizeschke, P.
Hochpräzises, dreidimensionales Erfassen des schichtweisen Lagenaufbaus beim selektiven Laserstrahlschmelzen mittels Streifenprojektion
Schweißen und Schneiden 75, 3 (2023) 160-165
Agour, M.; Falldorf, C.; Bergmann, R. B.
Improved 3D form profiler based on extending illumination aperture
Proc. SPIE 12618, Optical Measurement Systems for Industrial Inspection XIII, 126180T SPIE Optical Metrology, 2023, Munich, Germany (2023)
http://dx.doi.org/10.1117/12.2673783
Bergmann, R. B.; Falldorf, C.; Garcia Ortiz, A.; Müller, A. F.; Agour, M.; Bockelmann, C.
The coherence function for optical metrology: a new paradigm and the role of information theory and compressed sensing
Proc. SPIE 12619, Modeling Aspects in Optical Metrology IX, 1261902 (10 August 2023)
https://doi.org/10.1117/12.2675922
2022
Sperling, Y.; Bartsch, J.; Gauchan, S.; Bergmann, R. B.
Extending vision ray calibration by determination of focus distances
Optics Express 30, 26 (2022) 47801
Falldorf, C.; Rukin, I.; Müller, A. F.; Kroker, S.; Bergmann, R. B.
Functional pixels: a pathway towards true holographic displays using today’s display technology
Optics Express 30, 26 (2022) 47528
Agour, M.; Falldorf, C.; Taleb, F.; Castro-Camus, E.; Koch, M.; Bergmann, R. B.
Characterization of terahertz wavefront aberrations using computational shear-interferometry
Optical Engineering 61, 11 (2022) 114102-1-11
https://doi.org/10.1117/1.OE.61.11.114102
Agour, M.; Falldorf, C.; Taleb, F; Koch, M; Bergmann, R. B.; Castro-Camus, E
Chocolate inspection by means of phase-contrast imaging using multiple-plane terahertz phase retrieval
Optics Letters 47, 13 (2022) 3283-3286
https://doi.org/10.1117/1.OE.61.11.114102
Bergmann, R. B.; Fischer, A; Bockelmann, C; Dekorsy, A; Garcia-Ortiz, A; Falldorf, C.
The coherence function and its information content for optical metrology
tm – Technisches Messen 89, 6 (2022) 397-412
https://doi.org/10.1515/teme-2022-0048
Agour, M.; Falldorf, C.; Taleb, F.; Castro-Camus, E.; Koch, M.; Bergmann, R. B.
Terahertz referenceless wavefront sensing by means of computational shear-interferometry
Optics Express 30, 5 (2022) 7068-7081
https://doi.org/10.1364/OE.450708
Krause, C; Bergmann, R. B.; Falldorf, C.
Statistical analysis of phase values for the determination of step heights in multi-wavelength interferometry
tm – Technisches Messen 89, 6 (2022) 430–437
https://doi.org/10.1515/teme-2021-0139
Bergmann, R. B.
Optische In‐Prozess‐Messung: Konzepte für präzise, schnelle und robuste optische Messtechnik für komplexe
Messsituationen
DVS-Berichte 384. DVS Media GmbH, Düsseldorf (2022) 10 (Kurzfassung) ISBN 978-3-96144-208-9)
Bartsch, J.; Müller, S; Mattulat, T; Woizeschke, P; Bergmann, R. B.
Hochpräzises, dimensionelles Erfassen des schichtweisen Lagenaufbaus beim selektiven
Laserstrahlschmelzen mittels Streifenprojektion
DVS CONGRESS - Große Schweißtechnische Tagung. DVS Berichte Bd. 382. DVS Media GmbH, Düsseldorf (2022) 721-729
Müller, A. F.; Falldorf, C.; Agour, M.; Lotzgeselle, M.; Straub, A.; Ehret, G.; Bergmann, R. B.
Measurement of independent wave fields using estimation of signal parameters via rotational invariance techniques (ESPRIT) for aspheric and freeform surfaces
25th Congress of the International Commission for Optics (ICO) and 16th Conference of International Society on Optics Within Life Sciences (OWLS), Dresden
Agour, M.; Falldorf, C.; Taleb, F; Castro-Camus, E; Koch, M; Bergmann, R. B.
Shear interferometry for terahertz wavefront sensing
Proc. SPIE Photonics Europe 2022, Strasbourg/France. SPIE Terahertz Photonics II (2022) 12134
Müller, A. F.; Falldorf, C.; Bergmann, R. B.
Approaching optical metrology with multiple light sources and compressive sensing
Proc. of SPIE Photonics Europe 2022, Strasbourg/France. Optics and Photonics for Advanced Dimensional
Metrology II (2022) 121370L
Fischer, A; Bergmann, R. B.
Multidimensionale optische Messtechnik
TM– Technisches Messen 89, 6 (2022) 395-396
https://doi.org/10.1515/teme-2022-0022
2021
Bergmann, R. B.; Kalms, M..; Falldorf, C.
Optical In-Process Measurement: concepts for precise, fast and robust optical metrology for complex measurement situations
Applied Science 11 (2021) 10533
(doi.org/10.3390/app112210533)
Falldorf, C.; Agour, M.; Müller, A. F.; Bergmann, R. B.
Γ-profilometry: a new paradigm for precise optical metrology
Optics Express 29, 22 (2021) 36100-36110
Bartsch, J.; Sperling, Y.; Bergmann, R. B.
Efficient vision ray calibration of multi-camera systems
Opt. Express 29, 11 (2021) 17125-17139
https://doi.org/10.3390/photonics8070247
Müller, A. F.; Rukin, I.; Falldorf, C.; Bergmann, R. B.
Multicolor holographic display of 3D scenes using referenceless phase holography (RELPH)
Photonics 8, 247 (2021)
(doi.org/10.3390/photonics8070247)
Quasi-optical components for the THz-regime: fabrication and characterization
Proc. of the 122. DGaO Proceedings 2021. ISSN: 1614-8436 – urn:nbn:de:0287-2021-P009-9
Krause, C.; Falldorf, C.; Bergmann, R. B.
Statistical evaluation process to measure step heights using multi-lambda shear interferometry
Proc. of the 122. Jahrestagung der DGaO, Bremen (2021) ISSN: 1614-8436 – urn:nbn:de: 0287-2021-B022-9
Müller, A. F.; Gutiérrez-Canas Pazos, B.; Falldorf, C.; Bergmann, R. B.
Referenceless phase holography for displaying 3D scenes captured by digital holography
Proc. of the 122. Jahrestagung der DGaO, Bremen (2021) ISSN: 1614-8436 – urn:nbn:de: 0287-2021-B003-7
Gauchan, S.; Bartsch, J.; Bergmann, R. B.
Sichtfäden - Ein neuer Ansatz zur generischen Kamerakalibrierung
Proc. of the 122. Jahrestagung der DGaO, Bremen (2021) ISSN: 1614-8436 – urn:nbn:de: 0287-2021-B007-3
Falldorf, C.; Agour, M.; Bergmann, R. B.
Γ-Profilometry on rough surfaces
Proc. of the 122. Jahrestagung der DGaO, Bremen (2021) ISSN: 1614-8436 – urn:nbn:de: 0287-2021-B020-0
Bergmann, R. B.; Bockelmann, C.; Dekorsy, A.; Rosenhahn, B.; Falldorf, C.
7D-Metrology: The coherence function as a solution to complex problems of optical metrology
Proc. of. the 122. Jahrestagung der DGaO, Bremen (2021) ISSN: 1614-8436 – urn:nbn:de: 0287-2021-H001-6
Gauchan, S.; Bartsch, J.; Bergmann, R. B.
Vision threads – A novel approach to generic camera calibration
Proc. of SPIE 11787, Automated Visual Inspection and Machine Vision IV, 117870H (2021)
doi: 10.1117/12.2592296 (online)
Bartsch, J.; Sperling, Y.; Bergmann, R. B.
Qualification of holistic and generic camera-system calibration by Fringe Projection
Proc. of SPIE Vol. 11787, Automated Visual Inspection and Machine Vision IV (SPIE), eds: J. Beyerer, M. Heizmann, 117870G (2021) 109-118 (online)
doi.org/10.1117/12.2592295
Thiemicke, F.; Gesierich, A.; Li, W.; Falldorf, C.; Bergmann, R. B.
Digital holographic measurement system - robust digital holographic measurement system for production environments
PhotonicsViews 18, S1 (2021) 4-5 (E-Special LAF 2020)
https://doi.org/10.1002/phvs.202100007
2020
Agour, M.; Falldorf, C.; Bergmann, R. B.
Fast 3D form measurements using a tunable lens profiler based on imaging with LED illumination
Optics Express 29, 1 (2020) 385-399
Falldorf, C.; Agour, M.; Thiemicke, F.; Bergmann, R. B.
Lens based phase retrieval under spatially partially coherent illumination - Part I: Theory
Optics and Laser in Engineering 139 (2020) 106507
Agour, M.; Falldorf, C.; Thiemicke, F.; Bergmann, R. B.
Lens-based phase retrieval under spatially partially coherent illumination - Part II: Shape measurements
Optics and Lasers in Engineering 139 (2020) 106407
Agour, M.; Falldorf, C.; Bergmann, R. B.
Fast form measurements using a digital micro-mirror device in imaging with partially coherent illumination
Optics Letters 45, 22 (2020) 6154-6157
Müller, A. F.; Falldorf, C.; Lotzgeselle, M.; Ehret, G.; Bergmann, R. B.
Multiple Aperture Shear-Interferometry (MArS): a solution to the aperture problem for the form
measurement of aspheric surfaces
Optics Express 28, 23 (2020) 34677-34691
Kalms, M.; Bergmann, R. B.
Structure function analysis of powder beds in additive manufacturing by laser beam melting
Additive Manufacturing 36 (2020) 101396
Patra, S.; Bartsch, J.; Sperling, Y.; Kalms, M.; Bergmann, R. B.
Modelling the influences of technical surfaces on Phase Measuring Deflectometry
Proc. of 121 DGaO-Tagung (2020) ISSN: 1614-8436 – urn:nbn:de 0287-2020-A011-8
Bartsch, J.; Bergmann, R. B.
Phasenmessende Deflektometrie mit aktiver Displayregistrierung
Proc. of 121 DGaO-Tagung (2020) ISSN: 1614-8436 urn:nbn:de:0287-2020-A012-2
Agour, M.; Falldorf, C.; Bergmann, R. B.
Form profiler based on imaging with spatially partially coherent light
Proc. of 121 DGaO-Tagung (2020) ISSN: 1614-8436 – urn:nbn:de:0287-2020-A008-4
Lotzgeselle, M.; Straub, A.; Ehret, G.; Müller, A. F.; Falldorf, C.; Bergmann, R. B.
Iterative Bestimmung der Form von Asphären mittels Scher-Interferometrie und inversem Raytracing
Proc. of 121 DGaO-Tagung (2020) ISSN: 1614-8436 – urn:nbn:de 0287-2020-P009-6
Quality inspection and logistic quality assurance of micro technical manufacturing processes
Agour, M.; von Freyberg, A.; Staar, B.; Falldorf, C.; Fischer, A.; Lütjen, M.; Freitag, M.; Goch, G.; Bergmann, R. B.
In: Cold Micro Metal Forming, eds. F. Vollertsen, B. Kuhfuß, C. Thomy, S. Friedrich, P. Maaß, H.-W. Zoch
Springer Nature Switzerland AG, Cham/CH (2020) 256-274
Inspection of functional surfaces on micro components in the interior of cavities
Simic, M.; Staar, B.; Falldorf, C.; Lütjen, M.; Freitag, M.; Bergmann, R. B.
In: Cold Micro Metal Forming, eds. F. Vollertsen, B. Kuhfuß, C. Thomy, S. Friedrich, P. Maaß, H.-W. Zoch
Springer Nature Switzerland AG, Cham/CH (2020) 275-288
2019
Shape measurements by means of common path methods in coherent imaging
Agour, M.; Müller, A. F.; Thiemicke, F.; Bergmann, R. B.; Falldorf, C.
10th International Conference for Laser Applications (ICLA 10), Kairo (2019) 37
3D imaging system based on spherical wave field synthesis
Falldorf, C.; Chou, P.-Y.; Prigge, D.; Bergmann, R. B.
Applied Sciences, (2019), 9(18), 3862; https://doi.org/10.3390/app9183862
Improving the calibration of phase measuring deflectometry by a polynomial representation of the display shape
Bartsch, J.; Kalms, M.; Bergmann, R. B.
Eur. Opt. Soc.-Rapid Publ. (2019) 15:20, https://doi.org/10.1186/s41476-019-0116-1
Phase measurement deviations in deflectometry due to properties of technical surfaces
Patra, S. K., Bartsch, J., Kalms, M., Bergmann, R. B.
Proc. SPIE 11102, Applied Optical Metrology III, 111020Q (2019); DOI: http://dx.doi.org/10.1117/12.2527894
Assessing the Focal Length and Wavefront Error of Liquid Crystal Micro Lens Arrays
Chou, P.-Y., Prigge, D., Shieh, H. P. D., Bergmann, R. B., Falldorf, C.
In Digital Holography and Three-Dimensional Imaging, (Optical Society of America, 2019) pp. W2B-7
Simultaneous measurement of independent wave fronts using multiple signal classification
Falldorf, C., Müller, A. F., Agour, M., Bergmann, R. B.
In Digital Holography and Three-Dimensional Imaging, Optical Society of America, 2019) pp. M5A-5
Depth scanning using binary digital micro-mirror devices
Agour, M.; Falldorf, C., Bergmann, R. B.
in Digital Holography and Three-Dimensional Imaging 2019, OSA Technical Digest (Optical Society of America, 2019), paper W3A.22
Messen von asphärischen Linsenformen mittels räumlicher Kohärenz
Müller, A., Falldorf, C., Ehret, G., Bergmann, R. B.
tm – Technisches Messen, 0(0), pp. -. Retrieved 3 Jun. 2019, DOI: 10.1515/teme-2019-0025 (2019)
Ganzheitliche optische Messtechnik
Bergmann, R. B.; Falldorf, C.; Dekorsy, A.; Bockelmann, C.; Beetz, M.; Fischer, A.
Physik Journal 18 (2) S. 34 – 39 (2019)
In-line quality control using dimensional metrology of 3D metal parts printed by laser beam melting
Kalms, M.; Bergmann, R. B.
Proc. SPIE 10971, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure and Transportation XIII, 109710N (2019) doi: 10.1117/12.2514240
New approach to evaluate 3D laser printed parts in powder bed fusion-based additive manufacturing in-line within closed space
Kalms, M.; Narita, R.; Thomy, C.; Vollertsen, F.; Bergmann, R. B.
Additive Manufacturing 26 (2019) 161-165
Polymer-based holograms with individually adjustable structure angle
Klein, T.; Thiemicke, F.; Falldorf, C.; Bergmann, R. B.
Optical Engineering 58, 2 (2019) 025105-025105-7
2018
Autofocus in two-wavelength contouring for fast inspection of micro parts
Agour, M.; Falldorf, C.; Bergmann, R. B.
Sensors & Transducers, Vol. 226, Issue 10, October 2018, pp. 77-82
Spatial multiplexing and autofocus in holographic contouring for inspection of micro-parts
Agour, M.; Falldorf, C.; Bergmann, R. B.
Optics Express 26, 22 (2018) 28576-28588
Fast quality inspection of micro cold formed parts using telecentric digital holographic microscopy
Agour, M.; Falldorf, C.; Staar, B.; von Freyberg, A.; Fischer, A.; Lütjen, M.; Bergmann, R. B.
Proc. 5th Intern. Conf. on New Forming Technology (ICNFT 2018) MATEC Web of Conferences 190, 15008 (2018) doi.org/10.1051/matecconf/201819015008
Extended depth of focus using autofocus in two wavelength contouring for fast inspection of micro parts
Agour, M.; Thiemicke, F.; Falldorf, C.; Bergmann, R. B.
Proc. 1st International Conference on Optics, Photonics and Lasers (OPAL‘ 2018), IFSA Publishing, (2018) 205-208
Effects on non-ideal display properties in phase measuring deflectometry: A model-based investigation
Bartsch, J.; Nüß, J. R.; Prinzler, M.; Kalms, M.; Bergmann, R. B.
Proc. SPIE 10678, Optical Micro- and Nanometrology VII (2018) 106780Y1-10
Spatio-temporal sampling of the coherence function for step height measurements
Falldorf, C.; Hyra, A.; Simic, A.; Bergmann, R. B.
Proc. SPIE 10749, Interferometry XIX. SPIE Digital Library (2918) 107490Y-1-8; doi: 10.1117/12.2321145
Form metrology of optical surfaces based on partial coherent shearing interferometry in reflection
Hagemann, J.-H.; Falldorf, C.; Ehret, G.; Bergmann, R. B.
Proc. of the 18th International Conference & Exhibition (EUSPEN 2018), Venice/Italien (2018) online
Form determination of optical surfaces by measuring the spatial coherence function using shearing interferometry
Hagemann, J.-H; Falldorf, C.; Ehret, G.; Bergmann, R. B.
Optics Express 26 (2018) 27991-28001
FTS-Diamantdrehen strukturierter Oberflächen – Diamantdrehen mit erweiterten Freiheitsgraden
Holthusen, A. K.; Riemer, O.; Brinksmeier, E.; Thiemicke, F.; Falldorf, C.; Bergmann, R. B.
Wt Werkstofftechnik online 108, 11/12 (2018) 784
Characterization of technical surfaces by structure function analysis
Kalms, M.; Kreis, T.; Bergmann, R. B.
Proc. SPIE Vol. 10599, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XII, (2018) 1059924-1-8, DOI: 10.1117/12.2296309
Novel approach for shape measurement using light with low spatial coherence length
Klein, T.; Agour, M.; Hülsmann, T.; Schulze, P.; Falldorf, C.; Bergmann, R. B.
Proc. European Optical Society Biennial Meeting (EOSAM 2018), Delft/NL (2018) 249-250
Aktuelle Forschungsthemen zum Laserstrahleinsatz
Mittelstädt, C.; Blanke, N.; Czotscher, T.; Freiße, H.; Halisch, C.; Schultz, V.; Simic, A.; Stephen, A.; Tyralla, D.; Vetter, K.; Bergmann, R. B.
Schweißen und Schneiden 70, 9 (2018) 650-657
Lens inspection using multiple aperture shear interferometry: comparison to wave front sensing methods
Müller, A.; Falldorf, C.; Agour, M.; Hagemann, J.-H.; Ehret, G.; Bergmann, R. B.
Proc. der 119. Jahrestagung der DGaO. DGaO Proceedings (2018) ISSN 1614-8436
Metric for comparison of generic camera calibration
Prinzler, M.; Bartsch, J.; Kalms, M.; Bergmann, R. B.
Proc. SPIE Optical Engineering + Applications, San Diego/USA (2018) 107500I-1-9
Interlaboratory comparison measurements of aspheres
Schachtschneider, R.; Fortmeier, I.; Stavridis, M.; Asfour, J.; Berger, G.; Bergmann, R. B.; Beutler, A.; Blümel, T.; Klawitter, H.; Kubo, K.; Liebl, J.; Löffler, F.; Meeß, R.; Pruss, C.; Ramm, D.; Sander, M.; Schneider, G.; Wendel, M.; Widdershoven, I.; Schulz, M.; Elster, C.
Mess. Sci. Technol 29 (2018) 055010
Fast quality assurance of pipes
Simic, A.; Falldorf, C.; Bergmann, R. B.
Proc. European Optical Society Biennial Meeting (EOSAM 2018), Delft/NL (2018) 279-280
Multiple plane holographic projection using diamond turned holograms
Thiemicke, F.; Holthusen, A. K.; Bergmann, R. B.; Brinksmeier, E.
17th Workshop on Information Optics (WIO 2018) DOI 10.1109/WIO.2018.8643454
2017
Spatial multiplexing digital holography for speckle noise reduction in single-shot holographic two-wavelength contouring
Agour, M.; Klattenhoff, R.; Falldorf, C.; Bergmann, R. B.
Optical Engineering 56, 12 (2017) 124101-1-7, DOI: 0.1117/1.OE.56.12.124101
Kompensation der Abbildungsverzerrung in der digital holografischen Mikroskopie durch Einsatz eines telezentrischen Objektives
Agour, M.; Simic, A.; Falldorf, C.; Bergmann, R. B.
Fachbeiträge 8. Kolloquium Mikroproduktion, Bremen, 27.-28. November 2017, Hrsg.: F. Vollertsen, C. Hopmann, V. Schulze, J. Wulfsberg, BIAS Verlag (2017) 7-12, ISBN: 978-3-933762-56-6
Geometrische Auswertung digital holographischer Messungen im Bereich des Mikrokaltumformens
von Freyberg, A.; Agour, M.; Bergmann, R. B.; Fischer, A.
Fachbeiträge 8. Kolloquium Mikroproduktion, Bremen, 27.-28. November 2017, Hrsg.: F. Vollertsen, C. Hopmann, V. Schulze, J. Wulfsberg, BIAS Verlag (2017) 13-20, ISBN: 978-3-933762-56-6
Distortion free reconstruction in digital holographic microscopy
Agour, M.; Falldorf, C,; Bergmann, R. B.
Proc. of the Face2Phase Conference, Delft/NL (2017) 38
In-Line computational shear interferometry of insert moulded micro parts for optical application
Agour, M.; Flosky, C.; Riemer, O.; Falldorf, C.; Bergmann, R. B.
Advanced Manufacturing Technology (2016) doi:10.1007/s00170-016-9874-8 (online)
Speckle noise reduction in single-shot holographic two-wavelength contouring
Agour, M. ; Klattenhoff, R. ; Falldorf, C. ; Bergmann, R. B.
Proc. SPIE 10233, Holography: Advances and Modern Trends V, 102330R (2017); doi:10.1117/12.2264971
Computational methods in coherent optical metrology
Falldorf, C.; Agour, M.; Bergmann, R. B.
Proc. of AMA Conferences. AMA Publications, Wunstorf (2017) 239-243 (10.5162/sensor2017/B5.2)
Coherent imaging using the mutual intensity function
Falldorf, C.; Agour, M.; Bergmann, R. B.
Proc. of the Face2Phase Conference, Delft/NL (2017) 32
Computational Optical Metrology
Falldorf, C.; Bergmann, R. B.
Photonics Germany (2017) 64
Holographic 3D imaging through diffuse media by compressive sampling of the mutual intensity
Falldorf, C.; Klein, T.; Agour, M.; Bergmann, R. B.
Proc. of holography: Advances and Modern Trends V, eds.: M. Hrabovsky, J. T. Sheridan, A. Fimia.
SPIE Vol. 10233, SPIE Digital Library Bellingham WA (2017) 1023330-Q1-8
Sparse light fields in coherent optical metrology
Falldorf, C.; Hagemann, J.-H.; Ehret, G.; Bergmann, R. B.
Appl. Opt. 56, (F14-F19), (2017)
Virtual Shearing Interferometer with LED Illumination for Form Characterization of Optics
Hagemann, J.-H; Ehret, G; Andreas, B.; Bergmann, R. B.; Falldorf, C.
Proc. of the European Optical Society Annual Meeting (EOSAM 2016). European Optical Society (2017) 277-278
Error influences of the shear element in interferometry for form characterization of optics
Hagemann, J.-H.; Falldorf, C.; Ehret, G.; Bergmann, R. B.
Proc. SPIE Vol. 10329, Optical Measurement Systems for Industrial Inspection X, eds.: P. Lehmann, W. Osten, A. A. Goncalves jr. SPIE, Digital Library (2017) 103291T1-1
Distortion-free laser beam shaping for material processing using a digital micromirror device
Messaoudi, H.; Thiemicke, F.; Falldorf, C.; Bergmann, R. B.; Vollertsen, F.
Production Engineering – Research and Development 11, 3 (2017) 365-371
In-line quality control of micro parts using digital holography
Simic, A.; Freiheit, H.; Agour, M.; Falldorf, C.; Bergmann, R. B.
Proc. SPIE Vol. 10233, Holography: Advances and Modern Trends V, eds.: M. Hrabovsky, J. T. Sheridan, A. Fimia, SPIE Digital Library Bellingham WA (2017) 1023311
2016
Inspektion im Inneren von Mikrotiefziehbauteilen mittels digitaler Holografie
Simic, A.; Falldorf, C.; Bergmann, R. B.
Laser Magazin 4 (2016) 31
Holographic display system for dynamic synthesis of 3D light fields with increased space bandwidth product
Agour, M.; Falldorf, C.; Bergmann, R. B.
Optics Express 24 (2016) 14393-14405
Shape measurements of microscopic objects using computational shear interferometry
Agour, M.; Falldorf, C.; Bergmann, R. B.
Proc. of SPIE Vol. 9718, Quantitative Phase Imaging II, eds. G. Popescu, YK Parc. SPIE (2016) 97182M-1-8
Quantitative phase contrast imaging using a Nomarski microscope with variable shear distance
Falldorf, C.; Agour, M.; Kötter, J.; Bergmann, R. B.
Proc. of SPIE Vol. 9718. SPIE Digital Library (2016) 97182I-1-7
Realization of a shearing interferometer with LED multipoint illumination for form characterization of optics
Hagemann, J.-H.; Ehret, G.; Bergmann, R. B.; Falldorf, C.
DGaO Proceedings (2016) paper 20
Referenceless phase holography, a new 3D display method
Kreis, T.; Bergmann, R. B.
Proc. Digital Holography & Three -Dimensional Imaging, Heidelberg (2016) OSA
Technical Digest on Imaging and Applied Optics (2016) DTh4E.4 (online)
1 kHz 3.3 ìm Nd:YAG KTiOAsO4 optical parametric oscillator system for laser ultrasound excitation of carbon fiber-reinforced plastics
Puncken, O.; Mendoza Gandara, D.; Damjanic, M.; Mahnke, P.; Bergmann, R. B.; Kalms, M.; Peuser, P.; Wessels, P.; Neumann, J.; Schnars, U.
Applied Optics 55 (2016) 1310-1317
Internal inspection of micro deep drawing parts using digital holography
Simic, A.; Falldorf, C.; Bergmann, R. B.
Proc. Digital Holography & Three -Dimensional Imaging, Heidelberg (2016) OSA
Technical Digest on Imaging and Applied Optics (2016) DW1H.3 (online)
2015
Precision optical metrology without lasers
Bergmann, R. B.; Burke, J.; Falldorf, C.
Proc. SPIE 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015), eds.: Anand K. Asundi, Yu Fu, 952403-1-8 (2015) doi: 10.1117/12.2183451
Running droplet optical multiplexer
Brandhoff, L.; Akhtar, M.; Bülters, M.; Bergmann, R. B.; Vellekoop, M. J.
Optofluidics, Microfluidics and Nanofluidics 1 (2015) 62-68
A rapid prototyping framework for nano-photonic accelerators
Büter, W; Garcia-Ortiz, A; Ali, A; Mahmood, S; Arefin, S; Parsi Sreenivas, V; Bergmann, R B
Proc. 25th International Conference on Field Programmable Logic and Applications (FPL), London, 2015, pp. 1-4., doi: 10.1109/FPL.2015.7294004
Single shot lateral shear interferometer with variable shear
Falldorf, C.; Klattenhoff, R.; Bergmann, R. B.
Optical Engineering 54 (2015) 054105-1-6, doi: 10.1117/1.OE.54.5.054105
Digital holography and quantitative phase contrast imaging using computational shear interferometry
Falldorf, C.; Agour, M.; Bergmann, R. B.
Optical Engineering 54, (2015) 024110-1-7
Röntgen-Computertomograf für zerstörungsfreie Prüfung
Kalms, M.; Bergmann, R. B.
Laser Magazin 1 (2015) 39
Dynamic wave field synthesis: enabling the generation of field distributions with a large space-bandwidth product
Kamau, E., Heine, J., Falldorf, C., Bergmann, R. B.
Opt. Express 23, 28920-28934 (2015).
2014
Measuring the complex amplitude of wave fields by means of phase retrieval using partially coherent illumination
Agour, M.; Elshaffey, K.; v. Koyplow, C.; Bergmann, R. B.; Falldorf, C.
Proc. 7th International Workshop on Advanced Optical Metrology (Fringe 2013), ed. W. Osten. Springer-Verlag Berlin-Heidelberg (2014) 283-287
Nanophotonics in three dimensions: Heading from microelectronics towards optical computing
Bergmann, R. B., Parsi Sreenivas, V. V., Bülters, M., Garcia-Ortiz, A., Gutowski, J. and Lang, W.,
2nd Internat. Conf. on System-Integrated Intelligence (SysInt 2014), Bremen, 2.7.2014
Optical metrology on the micro and nano scale (Keynote)
Bergmann, R. B., Burke, J., Huferath-von Luepke S. and Falldorf C.
4th Internat. Conf. on Nanomanufacturing (NanoMan 2014), Bremen, 8.7.2014
Subsurface modification of crystalline silicon via ultra-short laser pulses for three dimensional separation
Bülters M.; Parsi Sreenivas, V. V.; Braun, A.; Teubner, U.; Bergmann, R. B.
Proc. 4th International Conference on Nanomanufacturing (nanoMan2014) 08.-10.07.2014 Bremen (CD-Rom)
3D DOEs in photosensitivem Foturan Glas
Bülters, M.; Kamau, E. N.; Parsi Sreenivas, V. V.; Falldorf C. Bergmann, R. B.
115. Jahrestagung der DGaO, Karlsruhe (11.06.2014)
Measurement of mould tool for laminar-flow carbon-fibre composite airplane wing cover
Burke, J.; Gesierich, A.; Li, W.; Bergmann, R. B.
Proc. Oldenburger 3D-Tage 2014, eds.: Luhmann, Müller. Wichmann Berlin (2014) 116-125
Messung eines Formwerkzeugs für einen Kohlefaser-Laminartragflächendeckel
Burke, J.; Gesierich, A.; Li, W.; Bergmann, R. B.
Oldenburger 3D-Tage (13.02.2014)
Precise optical metrology using computational shear-interferometry and an LCD monitor as light source
Falldorf, C.; Simic, A.; Ehret, G.; Schulz, M.; v. Koyplow, C.; Bergmann, R. B.
Proc. of the 7th International Workshop on Advanced Optical Metrology (Fringe 2013), ed. W. Osten. Springer-Verlag Berlin-Heidelberg (2014) 729-734
Calibration of a digital holographic microscope for wear detection
Huferath-von Lüpke, S.;Schröder, M.; Huke, P.; Bergmann, R B.
4th International Conference on Nanomanufacturing – nanoMan 2014, Bremen/Germany (10.07.2014)
Deflectometry vs. Shearography for detection of subsurface defects
Huke, P.; Burke, J.; Bergmann, R. B.
Proc. SPIE Vol. 9203, Interferometry XVII: Techniques and Analysis. eds: Katherine Creath, Jan Burke, Joanna Schmit, SPIE Bellingham (2014), 92030C, DOI: 10.1117/12.2063650
Advanced wave field sensing using Computational Shear Interferometry
Falldorf, C.; Agour, M.; Bergmann, R. B.
Proc. SPIE Vol. 9204, Interferometry XVII: Advanced Applications. SPIE Bellingham (2014), 92040C-1-9
Complete shape measurement of micro parts by digital holography
Huferath-von Luepke, S., Klattenhoff, R., Dankwart, C., Falldorf, C., Bergmann R.B.
Proc. of SPIE; Interferometry XVI: Techniques and Analysis, eds.: K. Creath, J. Burke, J. Schmit. SPIE Bellingham (2014) 920302-1-8
Digital holography for inline wear recording on deep drawing tools
Huferath-von Luepke, S.; Bergmann, R. B.
Proc. 4th International Conference on Nanomanufacturing (nanoMan2014) 08.-10.07.2014 Bremen (CD-Rom)
Efficient laser generation of Lamb waves
Huke, P.; Schröder, M.; Hellmers, S.; Kalms, M.; Bergmann, R.B.
Optics Letters 39 (2014) 5795-5797
Assessment of bond defects in adhesive joints before and after the treatment with laser generated shock waves
Kalms, M.; Hellmers, S.; von Kopylow, C.; Wilken, R.; Bergmann, R. B.
Proc. SPIE 9063, Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2014, 906327 (9 March 2014)
https://doi.org/10.1117/12.2044792
Beam shaping using liquid crystal-on-silicon spatial light modulators for laser ultrasound generation
Kalms, M.; Hellmers, S.; Huke, P.; Bergmann, R. B
Optical Engineering 53 (2014) 044110-1-6
Fabrication of 3D DOEs in photosensitive Foturan Glass
Kamau, E. N.; Bülters, M.; Sanchez Alvarez, C.; Parsi Sreenivas, V. V.; Falldorf, C.; Bergmann, R. B.
4th International Conference on Nanomanufacturing – nanoMan 2014, Bremen/Germany (08.07.2014)
Surface characterization by structure function analysis
Kreis, Th.; Burke, J.; Bergmann, R. B.
J. Europ. Opt. Soc. Rap. Public 9 (2014) 14032-1-8
Optical Vector Matrix Multiplier for On-Chip Computation
Parsi Sreenivas, V. V; Bülters, M.; Dumstorff, G; Chauhan, A; Garcia-Ortiz, A; Bergmann, R. B.
European Optical Society Annual Meeting (EOSAM 2014) Berlin (CD-Rom)
Optical waveguides via laser micro machining
Parsi Sreenivas, V. V.; Bülters, M.; Morosov, K.; Bergmann, R. B.
Proc. 4th International Conference on Nanomanufacturing (nanoMan2014) 08.-10.07.2014 Bremen (CD-Rom)
Three dimensional fabrication of optical waveguiding elements for on-chip integration
Parsi Sreenivas, V.; Bülters, M. Schröder, M.; Bergmann, R. B.
Proc. SPIE Vol. 9130, Micro-Optics 2014, eds.: H.Thienpont, J. Mohr, H. Zappe, H. Nakajima. SPIE Bellingham WA (2014) 91300M1-7
Improving the Generic Camera Calibration technique by extended model of calibration display
Reh, T.; Li, Wansong; Burke, J.; Bergmann, R.B.
J. Europ. Opt. Soc. Rap. Public 9 (2014) 14044-1-4
Axially distributed sensing with a monoscopic imaging lens for single-shot distance measurements
Sandner, M.; Kolenović, E.; Klattenhoff, R.; Kolenović, E.; Elandaloussi, F.; v. Kopylow, C.; Bergmann, R. B.
Applied Optics 53 (2014) 5078 – 5083
Fabrication of 3d-microstructures for calibration of a holographic metrology system
Schröder, M.; Huferath-von Luepke, S.; Bülters, M.; Bergmann, R. B.
Proc. 4th International Conference on Nanomanufacturing (nanoMan2014) 08.-10.07.2014 Bremen (CD-Rom)
Dimensional Quality Inspection of Metallic Micro Components in Micro Bulk Manufacturing
Weimer, D.; Huferath-v. Lüpke, S.; Tausendfreund, A.; Lübke, K.; Falldorf, C.; Lütjen, M.; von Freyberg, A.; Bergmann, R B.; Goch, G.; Scholz-Reiter, B.
Advanced Materials Research Vol. 1018. TransTechn Publications Switzerland (2014) 493-500
A Comparison of in-situ Measuring Systems within Micro Cold Forming
Weimer, D., Huferath-von Lüpke, S., Falldorf, C., Lütjen, M., Tausendfreund, A., Kreis, Th., von Freyberg, A., Bergmann, R.B., Goch, G., Scholz-Reiter, B.
Proc. 4th International Conference on Nanomanufacturing (nanoMan2014) 8 – 10 July, 2014, Bremen (CD-Rom)
2013
Phase retrieval using constrains derived from the Helmholtz equation
Agour, M.; Kolenovic, E.; Falldorf, C.; v. Kopylow, C.; Jüptner, W.; Bergmann, R.B.
Computational Optical Sensing and Imaging (COSI-2013); OSA Technical Digest, Optial Society of America (2013) CTu3C.3
Investigation of composite materials using SLM-based phase retrieval Direct link
Agour, M.; Falldorf, C.; Bergmann, R. B.
Optics Letters Vol. 38 (2013) 2203-2205
Advanced optical metrology for quality control (invited talk)
Bergmann, R. B.
Lasers in Manufacturing (LIM 2013), München (13.05.2013)
Qualifying parabolic mirrors with deflectometry Direct link
Burke, J.; Li, W.; Heimsath, A.; v. Kopylow, C.; Bergmann, R.B.
J. Europ. Opt. Soc. Rap. Public 8 (2013) 13014-1-6
Wave field sensing by means of computational shear interferometry Direct link
Falldorf, C.; v. Kopylow, C.; Bergmann, R. B.
J. Optical Society of America A. 30 (2013) 1905-1912
Computational shear interferometry for digital holography
Falldorf, C.; Bergmann, R. B.
SPIE Newsroom (2013) nur online
Novel trends in optical non-destructive testing methods Direct link
Huke, P., Klattenhoff, R.; v. Kopylow, C. Bergmann, R. B.
J. Europ. Opt. Soc. Rap. Public, 8, 13043 (2013) 1-7
Nondestructive testing in an automated process chain for mass manufacturing of fiber reinforced thermoplastic components
Kalms, M.; Hellmers, S.; v. Kopylow, C.; Bergmann, R. B.,
Proc. SPIE Vol. XXXX Conference on Nondestructive Characterization for Composite Materials, Aerospace, Engineering, Civil Infrastructure, and Homeland Security VI, eds.: T Y. Yu, A. L. Gyekenyesi, P. J. Shull, A. A. Diaz, H. F. Wu. SPIE Bellingham (2013) 869429-1-9
Least-square based inverse reconstruction of in-line digital holograms
Kamau, E. N.; Burns, N.; Falldorf, C.; v. Kopylow, C.; Watson, J; Bergmann, R. B.
J. Optics 15 (2013) 075716
A new approach to dynamic wave field synthesis using computer generated volume holograms
Kamau, E. N., Falldorf, C., Bergmann, R. B.
Information Optics WIO (2013) 12th Workshop on. IEEE Xplore Tenerife/Spain (2013)1-3 (online)
Digital holographic system for the imaging and analysis of living marine plankton interrelational behavior
Kamau, E.N. ; Huke, P.; Bergmann, R. B.
3rd EOS Topical Meeting (on Blue Photonics – Optics in the Sea (2013) o.S.
Non-equilibrium Grain Size Distribution with Generalized Growth and Nucleation Rates
Lokovic, K. S.; Bergmann, R. B.; Bill, A.
J. Mater. Res., 28 (2013) 1407-1412
Vision ray camera calibration for small field of view
Reh, T; Li, W; Gesierich, A; Bergmann, R. B.
DGaO-Proceedings 2013 (online)
Areal absolute form measurement of optical surfaces using phase measuring deflectometry and shearing interferometry
Sandner, M.; Falldorf, C.; Simic, A.; Burke, J.; Bergmann, R. B.
Proc. 6th High Level Expert Meeting on Asphere Metrology, Braunschweig (2013) (CD)
2012
Misalignment compensation in spatial light modulator based optical filtering techniques
Agour, M.; Falldorf, C.; v. Koyplow, C.; Bergmann, R. B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)
Design of diffractive optical elements for multiple wavelength image formation by gradient-based methods
Dankwart, C.; Falldorf, C.; v. Kopylow, C.; Bergmann, R.B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)
Three dimensional optical components on IC surfaces for on-chip communication
Bülters, M.; Schröder, M.; Bergmann, R. B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)
Reduction of speckle noise in multi wavelength contouring Direct link
Falldorf, C.; Huferath-von Luepke, S.; v. Kopylow, C.; Bergmann, R. B.
Applied Optics 51, 8211-8215 (2012)
Holographic imaging utilizing pulsed ultra violet lasers and diamond-turned diffractive optical elements
Kibben, S.; Koerdt, M.; Dankwart, C.; Bergmann, R. B.; Vollertsen, F.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)
Non-destructive testing of carbon reinforced plastics by means of phase retrieval
Agour, M.; Falldorf, C.; v. Kopylow, C.; Bergmann, R. B.
Proc. SPIE Vol. XXXX, V International Conference on Speckle Metrology (Speckle 2012), eds.: A. F.Doval, C. Trillo, J. C. Lopez-Vazquez. SPIE Bellingham (2012) 841318-1-5
A fast and robust approach to phase shift registration from randomly phase shifted interferograms
Hildebrand, A.; Falldorf, C.; v. Kopylow, C.; Bergmann, R. B.
Proc. SPIE Vol. 8413. SPIE Bellingham (2012) 84130R
Design and simulation of three-dimensional optical polymer waveguide devices for photonic on-chip application
Schröder, M.; Bülters, M.; Bergmann, R. B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)
Non-linear optimization for the reconstruction of wavefronts from gradient data
Falldorf, C.; Li, W.; v. Kopylow, C.; Bergmann, R. B.;
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)
Comparative digital holographic microscope for wear detection at micro deep drawing tools
Huferath-von Lüpke, S., Zuch, U., Huke, P., v. Kopylow, C., Bergmann, R. B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)
Optical non-destructive testing methods
Huke, P., v. Kopylow, C. Bergmann, R. B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)
Laser-generated ultrasound with liquid crystal on silicon (LCoS) technology in the thermoelastic regime
Kalms, M.; Hellmers, S.; Bergmann, R. B.
Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security (2012) eds.: A. L. Gyekenyesi, T.-Y. Yu, P. J. Shull, A. A. Diaz, H. F. Wu. SPIE Bellingham/Washington (2012) 83470N1-9
Point Source Based Model for the Inverse Numerical Reconstruction of Digital Holograms
Kamau, E. N.; Wang, N.; Falldorf, C.; v. Kopylow, C.; Bergmann, R. B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)
Qualifying parabolic mirrors with deflectometry
Li, W.; Heimsath, A.; Burke, J.; v. Kopylow, C.; Bergmann, R. B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)
Microsized subsurface modification of mono-crystalline silicon via non-linear absorption Direct link
Parsi Sreenivas, V. V., Bülters, M., Bergmann, R. B.
J. Europ. Opt. Soc. Rap. Public 7 (2012) 12035-1-5
Subsurface modification in mono-crystalline silicon by multiphoton processes – analytical model and first results
Parsi Sreenivas, V. V., Bülters, M., Bergmann, R. B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)
Messen und Prüfen mit Licht
Sandner, M.; Burke, J.; v. Kopylow, C.; Bergmann, R. B.
wt Werkstattstechnik online, 11/12 (2012) 777-782
Novel concept for three-dimensional polymer waveguides for Optical on-Chip Interconnects Direct link
Schröder, M.; Bülters, M.; v. Kopylow, C.; Bergmann, R. B.
J. Europ. Opt. Soc. Rap. Public 7 (2012) 12027-1-4
Wear recording at micro deep drawing tools with comparative digital holography Direct link
Huferath-von Lüpke, S., Huke, P., v. Kopylow, C., Bergmann, R.B.
J. Europ. Opt. Soc. Rap. Public 7 (2012) 12041-1-7
Phase Retrieval for Optical Inspection of Technical Components
Falldorf, C.; Agour, M.; v. Kopylow, C.; Bergmann, R. B.
J. Opt. 14 (2012) 065701
2011
Wear recording at micro deep drawing tools with comparative digital holography
S. Huferath-von Lüpke, P. Huke, C. von Kopylow, Ralf B. Bergmann,
Proc. 1st EOS Topical Meeting on Micro- and Nano-Optoelectronic systems, 7.-9.12.2011, Bremen (CD-ROM), ISBN 978-3-00-033711-6 (2011)
Novel concept for three-dimensional polymer waveguides
M. Schröder, V. V. Parsi Sreenivas, C. von Kopylow, Ralf B. Bergmann
Proc. 1st EOS Topical Meeting on Micro- and Nano-Optoelectronic systems, 7.-9.12.2011, Bremen (CD-ROM), ISBN 978-3-00-033711-6 (2011)
Novel three-dimensional Polymer Waveguides for Optical on-Chip Interconnects
M. Bülters, M. Schröder, C. von Kopylow, Ralf B. Bergmann,
Proc. 1st EOS Topical Meeting on Micro- and Nano-Optoelectronic systems, 7.-9.12.2011, Bremen (CD-ROM), ISBN 978-3-00-033711-6 (2011)
Nanosized subsurface modification of mono-crystalline Silicon via non-linear absorbtion
V. V. Parsi Sreenivas, M. Bülters, C. von Kopylow, Ralf B. Bergmann
Proc. 1st EOS Topical Meeting on Micro- and Nano-Optoelectronic systems, 7.-9.12.2011, Bremen (CD-ROM), ISBN 978-3-00-033711-6 (2011)
Automated compensation of misalignment in phase retrieval based on a spatial light modulator Direct link
M. Agour, C. Falldorf, C. von Kopylow, Ralf B. Bergmann
Applied Optics 50, 4779-4787 (2011)
The effect of misalignment in phase retrieval based on a spatial light modulator
M. Agour, C. Falldorf, C. von Kopylow, Ralf B. Bergmann
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80820M (26 May 2011); doi: 10.1117/12.889200; https://doi.org/10.1117/12.889200
Schnelle 3D-Formerfassung von Mikrotiefziehbauteilen mittels digitaler Holografie
N. Wang, C. von Kopylow, C. Falldorf, Ralf B. Bergmann
Photonik 4, 40-42 (2011)
Assessment of digital holography for 3D-shape measurement of micro deep drawing parts in comparison to confocal microscopy
N. Wang, C. Falldorf, C. von Kopylow and Ralf B. Bergmann,
MEMS and Nanotechnology, Vol. 4: Proceedings of the 2011 Annual Conference
Proc. Society for Experimental Mechanics (SEM), Ed.: Tom Proulx, Springer, Berlin (2011)
Development of the grain size distribution during the crystallization of an amorphous solid
A. Bill, Ralf B. Bergmann
MRS Proceedings, 1308, Mrsf10-1308-dd03-01. doi:10.1557/opl.2011.506
Contactless defect detection using optical methods for non destructive testing NdT
Ph. Huke, O. Focke, C. Falldorf, C. von Kopylow, Ralf B. Bergmann, Proceedings of the 2nd Symposium on NDT in Aerospace 2010 (CD-ROM), (2011)
2010
Resolution enhancement by time-multiplexed acquisition of sub-pixel shifted images employing a spatial light modulator
A. Hildebrand, C. Falldorf, C. von Kopylow, Ralf B. Bergmann,
Proc. International Symposium on Optomechatronic Technologies (ISOT 2010), eds.: F. Janabi-Sharifi and J. Kofman, IEEE (2010), pp. 1-6, DOI: 10.1109/ISOT.2010.5687353 (CD-ROM)
Measurement of thermally induced deformations by means of phase retrieval
C. Falldorf, M. Agour, C. von Kopylow, Ralf B. Bergmann, Proceedings International Symposium on Optomechatronic Technologies (ISOT 2010), eds.: F. Janabi-Sharifi and J. Kofman, IEEE (2010), pp. 1-5, DOI: 10.1109/ISOT.2010.5687376 (CD-ROM)
Liquid crystal spatial light modulators in optical metrology (Invited paper)
C. Falldorf, C. von Kopylow, Ralf B. Bergmann
Invited Paper, Information Optics (WIO), 2010 9th Euro-American Workshop on Information Optics, Helsinki, eds.: T. J. Naughton, B. Javidi, IEEE (2010), pp. 1-3, DOI: 10.1109/WIO.2010.5582527 (CD-ROM)
Vision ray calibration for the quantitative geometric description of general imaging and projection optics in metrology Direct link
Th. Bothe, W. Li, M. Schulte, C. von Kopylow, R. B. Bergmann, W. P. O. Jüptner
Applied Optics 49, pp 5851-5860 (2010)
Optical metrology and optical non-destructive testing from the perspective of object characteristics (Invited paper)
Ralf B. Bergmann, T. Bothe, C. Falldorf, P. Huke, M. Kalms, C. von Kopylow
Proc. SPIE Vol. 7791, Interferometry XV: Applications, 1-15, Bellingham, WA., USA (2010)
Grain size distribution in crystallization processes with anisotropic growth rate
Andreas Bill, K. S. Lokovic, Ralf B. Bergmann
MRS Spring Meeting, Symposium A, Vol. 1245 (2010), 1245-A16-07 (online)
Time evolution of the grain size distributions in random nucleation and growth crystallization processes
Anthony V. Teran, Andreas Bill, Ralf B. Bergmann.
Physical Review B 81(2010) 075319-1-19
Design of an optical system for phase retrieval based on a spatial light modulator
C. Falldorf, M. Agour, C. von Kopylow, Ralf B. Bergmann
in: Proceedings on „Advanced Phase Measurement Methods in Optics and Imaging“, Locarno, Switzerland (2010), p. 259-264
Digital alignment of a reconstructed hologram with an object for measurement of deterioration of tools
S. Huferath-von Lüpke, T. Baumbach, E. Kolenovic, C. Falldorf, C. v. Kopylow, Ralf B. Bergmann
in: Proceedings 36th Internat. MATADOR Conference 2010, eds.: S. Hinduja, L. Li, Springer Verlag London (2010), p. 331-334
Modeling of the optical behavior of diamond turned holograms
C. Dankwart, C. Falldorf, C. von Kopylow, Ralf B. Bergmann
Proc. EOS Topial Meeting on Diffractive Optics 2010-EOS 2010 (CD-ROM)
Phase retrieval by means of a spatial light modulator in the fourier domain of an imaging system Direct link
C. Falldorf, M. Agour, C. von Kopylow, Ralf B. Bergmann
Applied Optics 49 (2010), p. 1826-1830
Design of a diamond turned hologram incorporating properties of the fabrication process Direct link
C. Dankwart, C. Falldorf, R. Gläbe, B. Lünemann, C. von Kopylow, Ralf B. Bergmann
Applied Optics 49 (2010), 4949-4955
2009
Measurement of Optical Components
Ralf B. Bergmann, Th. Bothe, C. Falldorf, C. von Kopylow
Proc. Internat. Molded Optics Conference 2009 (iMOC 2009)
Holographic projection based on Diamond Turned Diffractive Optical Elements Direct link
C. Falldorf, C. Dankwart, R. Gläbe, B. Lünemann, C. von Kopylow, Ralf B. Bergmann
Applied Optics 48 (2009), 5782-5785
The Fringe Reflection Technique for Lens Inspection and Specular Freeform Measurement
T. Bothe, W. Li, C. von Kopylow, Ralf B. Bergmann
MAFO Ophthalmic Labs & Industry 5 (2009), p. 38-42
Lateral Shearing Interferometer based on a Spatial Light Modulator in the Fourier Plane
C. Falldorf, R. Klattenhoff, A. Gesierich, C. von Kopylow, R. B. Bergmann
Proc. FRINGE 2009 – The 6th International Workshop on Advanced Optical Metrology, p. 93 – 98 (2009)
2008
On the origin of logarithmic-normal distributions: An analytical derivation, and its application to nucleation and growth processes
Ralf B. Bergmann, Andreas Bill
J. Crystal Growth 310/13, 3135-3138 (2008)
On the logarithmic-normal distribution in nucleation and growth processes
Andreas Bill, Anthony Teran, Ralf B. Bergmann
APS-Spring Meeting 2008, Abstract only
2006
Non-Destructive Testing in the Automotive Supply Industry – Requirements, Trends and Examples Using X-ray CT“ (invited paper)
Ralf B. Bergmann, Florian T. Bessler and Walter Bauer
in: 9th Europ. Conf. for Non-Destructive Testing, Berlin, September 25 – 29, 2006, DGZFP Proceedings BB 103-CD, Th.1.6.1
2004
Computer tomography for non-destructive testing in the automotive industry
Walter Bauer, Florian T. Bessler, Erich Zabler and Ralf B. Bergmann
in: SPIE Conference, Denver, USA, August 2004, Session 12, Materials Research II, Talk No. 5535-50
2003
Röntgen-Computertomographie in der industriellen Fertigung – Anwendungen und Entwicklungsziele
E. Zabler, M. Rosenberger-Koch und R. B. Bergmann
in: Jahrestagung der Dt. Gesellschaft für zerstörungsfreie Prüfung (DGZFP), Tagungsband auf CD-ROM (DGZFP, 2003), V 17
Low-temperature epitaxy on polycrystalline silicon substrates
T. A. Wagner, L. Oberbeck, R. B. Bergmann, M. Nerding, H. P. Strunk and J. H. Werner
Solid State Phenomena 93, 121 (2003)
Single to polycrystalline transition in silicon growth by ion assisted deposition at low temperatures
M. Nerding, L. Oberbeck, T. A. Wagner, R. B. Bergmann and H. P. Strunk
J. Applied Physics 93, 2570 (2003)
2002
„Growth, characterization and electronic applications of Si-based thin films“
Volume Editor: Ralf B. Bergmann (Research Signpost, Trivandrum, India, 2002).
Contributions:
„Thin film transistors for flexible electronics“ by S. Wagner, H. Gleskova, I. Chun Cheng and M. Wu;
„Nucleation and growth dynamics in polycrystalline Si (SiGe) thin films formation“ by H. Kumomi;
„Laser crystallization of Si and SiGe films“ by J. R. Köhler;
„Solid phase crystallization of Si and Ge:“ by H. Atwater and C. M. Chen;
„Zone melting recrystallization of Si films for solar cells“ by T. Ishihara;
„Thin film Si-based opto¬electronics“ by S. Pizzini and S. Binetti;
„Low temperature epitaxial growth of Si and SiGe films“ by L. Oberbeck;
„High temperature deposition and epitaxy of Si and SiGe“ by A. Slaoui, J. Poortmans and M. Caymax;
„Transfer of monocrystalline Si films for thin film solar cells“ K. J. Weber, M. Stocks, A. W. Blakers and M. McCann;
„Transfer of monocrystalline Si films for silicon on insulator devices“ N. Sato, K. Ohmi, and T. Yonehara;
„Thin semiconductor films: Future trends“ by H.-J. Queisser
Advances in Monocrystalline Si Thin Film Solar Cells by Layer Transfer
R. B. Bergmann, C. Berge, T. J. Rinke, J. Schmidt, and J. H. Werner
Solar Energy Materials & Solar Cells 74, 213 (2002)
The Future of Crystalline Silicon Films on Foreign Substrates
R. B. Bergmann and J. H. Werner
Thin Solid Films 403-404, 162-169 (2002)
Optimization and characterization of amorphous/crystalline silicon heterojunction solar cells
N. Jensen, R. M. Hausner, R. B. Bergmann, J. H. Werner, and U. Rau
Prog. Photovolt. Res. & Appl. 10, 1-13 (2002)
Low temperature epitaxial Silicon films deposited by ion-assisted deposition
T. A. Wagner, L. Oberbeck, and R. B. Bergmann
Mat. Sci. Eng. B 89, 319 (2002)
Monocrystalline Si Thin Film Solar Cells by Layer Transfer
C. Berge, R. B. Bergmann, T. J. Rinke, and J. H. Werner
Proc. 17th Europ. Photov. Solar Energy Conf., B. McNelis, W. Palz, H. A. Ossenbrink, and P. Helm, Eds. (WIP Munich, Germany, 2002), p. 1277
Application of plasma silicon nitride to crystalline thin-film silicon solar cells
J. Schmidt, L. Oberbeck, T. J. Rinke, C. Berge, R. B. Bergmann
in Proc. 17th Europ. Photov. Solar Energy Conf., B. McNelis, W. Palz, H. A. Ossenbrink, and P. Helm, Eds. (WIP Munich, Germany, 2002), p. 1351
2001
High rate deposition of epitaxial layers for efficient low temperature thin film epitaxial silicon solar cells
L. Oberbeck, J. Schmidt, T. Wagner, and R. Bergmann
Prog. Photovolt. Res. Appl. 9, 333 (2001)
Orientation-Dependence of Low Temperature Epitaxiasl Silicon Growth
T. A. Wagner, L. Oberbeck, M. Nerding, H. P. Strunk and R. B. Bergmann
Mat. Res. Soc. Symp. Proc. 664, A22.3 (2001)
Crystalline Silicon Thin Film Solar Cells
Jürgen H. Werner and Ralf B. Bergmann
in Techn. Digest 12th Int. Photovolt. Science and Engineering Conf. (Kyung Hee Information Printing, Seoul, 2001), p. 69
Monocrystalline Si Films from Transfer Processes for Thin Film Devices
Ralf B. Bergmann, Christopher Berge, Titus J. Rinke, and Jürgen H. Werner
Mat. Res. Soc. Symp. Proc. 685E, D2.1 (2001)
Intra grain defects – limiting factor for low temperature polycrystalline silicon films
T. A. Wagner, L. Oberbeck, R. B. Bergmann, J. H. Werner
Solid State Phenom. 80-81, 95 (2001)
High-quality and low-temperature epitaxial Si films deposited at very high deposition rate
R. B. Bergmann, L. Oberbeck, and T. A. Wagner
J. Crystal Growth 225, 335 (2001)
From polycrystalline to single crystalline silicon on glass
J. H. Werner, R. Dassow, T. J. Rinke, J. R. Köhler, and R. B. Bergmann
Thin Solid Films 383, 95(2001)
Thin film solar cells on glass based on the transfer of monocrystalline Si films
R. B. Bergmann, T. J. Rinke, T. A. Wagner, and J. H. Werner
Solar Energy Materials & Solar Cells 65, 355 (2001)
2000
Ion-assisted deposition of silicon epitaxial films with high deposition rate using low energy silicon ions
Lars Oberbeck, Thomas A. Wagner, and Ralf B. Bergmann
Mat. Res. Soc Symp. Proc. 609, A7.1.1 (2000)
Ions allow silicon growth to keep its cool
L. Oberbeck and R. B. Bergmann
Vacuum Solutions 18, 31 (2000)
Efficient thin film solar cells by transfer of monocrystalline Si layers
T. J. Rinke, R. B. Bergmann and J. H. Werner
in: Proc. 16th European Photovoltais Solar Energy Conference, Eds.: H. Scheer, B. McNelis, W. Palz, H. A. Ossenbrink and P. Helm (James & James Science Publishers Ltd., London, 2000), p. 1128
Perspectives of crystalline Si thin film solar cells: A new era of thin monocrystalline Si-films?
R. B. Bergmann and T. R. Rinke
Prog. Photovolt.: Res. Appl. 8, 451 (2000)
Solarzellen und Mikrochips von morgen
R. B. Bergmann, T. J. Rinke and J. H. Werner, Physikalische Blätter, Vol. 56, Nr. 9, 51 (2000)
Monocrystalline Si thin film solar cells: A new era for thin film photovoltaics?
R. B. Bergmann, T. J. Rinke, and J. H. Werner,
in 10th Workshop on Crystalline Silicon Solar Cell Materials and Processes, Ed. B. L. Sopori (NREL, Golden Colorado, 2000), p. 125
Electronic properties of silicon epitaxial layers deposited by ion-assisted deposition at low temperatures
L. Oberbeck and R. B. Bergmann
J. Appl. Phys. 88, 3015 (2000)
Structure and properties of quasi-monocrystalline Si thin films
T. J. Rinke, R. B. Bergmann, and J. H. Werner
Mat. Res. Soc. Symp. Proc. 558, 251 (2000)
Recombination mechanisms in amorphous silicon/crystalline silicon heterojunction solar cells
N. Jensen, U. Rau, R. M. Hausner, S. Uppal, L. Oberbeck, R. B. Bergmann and J. H. Werner
J. Appl. Phys. 87, 2639 (2000)
Low-temperature processing of crystalline Si films on glass for electronic applications
R. B. Bergmann, T. J. Rinke, L. Oberbeck, and R. Dassow
in: Perspectives, Science and Technologies for Novel Silicon on Insulator Devices, Eds.: P. L. F. Hemment, V. S. Lysenko and A. N. Nazarov, NATO Science Series 3. High Technology – Vol. 73 (Kluwer Academic Publishers, Dordrecht, 2000), p. 109
1999
Perspectives of Crystalline Silicon Thin Film Solar Cells
J. H. Werner and R. B. Bergmann
in: Technicals Digest 11th Intern. Photov. Science and Engin. Conf., Sapporo (Tokyo University of Agriculture & Technology, Tokyo, 1999), p. 923
Crystalline Si Films on Foreign Substrates for Electronic Applications
R. B. Bergmann
in: Recent Res. Devel. Crystal Growth Res. 1, 241 (1999)
Material Aspects of Crystalline Silicon Thin Film Solar Cells on Glass
R. B. Bergmann
in: 9th Workshop on Crystalline Silicon Solar Cell Materials and Processes (NREL, Golden, Colorado, 1999), p. 94
Thin film solar cells on glass by transfer of monocrystalline Si films
R. B. Bergmann, T. J. Rinke, R. M. Hausner, M. Grauvogl, M. Vetter, and J. H. Werner
International Journal of Photoenergy 1, 83 (1999)
Crystalline Si thin film solar cells: A review
R. B. Bergmann
Applied Physics A 69, 187 (1999)
Quasi-monocrystalline silicon for thin film devices
T. J. Rinke, R. B. Bergmann, and J. H. Werner
Applied Physics A 68, 705 (1999)
Laser-crystallized polycrystalline silicon on glass for photovoltaic applications
R. Dassow, J. R. Köhler, M. Grauvogl, R. B. Bergmann, and J. H. Werner
Solid State Phenomena 67-68, 193 (1999)
Low-temperature silicon-epitaxy by ion-assisted deposition
L. Oberbeck, R. B. Bergmann, N. Jensen, S. Oelting, and J. H. Werner
Solid State Phenomena 67-68, 459 (1999)
Heterojunctions for polycrystalline silicon solar cells
R. M. Hausner, N. Jensen, R. B. Bergmann, U. Rau, and J. H. Werner
Solid State Phenomena 67-68, 571 (1999)
Ultrathin quasi-monocrystalline silicon films for electronic devices
T. J. Rinke, R. B. Bergmann, R. Brüggemann, and J. H. Werner
Solid State Phenomena 67-68, 229 (1999)
Large-grained polycrystalline silicon on glass by copper vapor laser annealing
J. R. Köhler, R. Dassow, R. B. Bergmann, J. Krinke, H. P. Strunk, and J. H. Werner
Thin Solid Films 337, 129 (1999)
1998
High rate, low-temperature deposition of crystalline silicon films for thin film solar cells on glass
R. B. Bergmann, R. M. Hausner, N. Jensen, M. Grauvogl, L. Oberbeck, T. Rinke, M. B. Schubert, Ch. Zaczek, R. Dassow, J. R. Köhler, U. Rau, S. Oelting, J. Krinke, H. P. Strunk, and J. H. Werner
in: Proc. 2nd World Conference on Photovoltaic Energy Conversion, eds: J. Schmid, H. A. Ossenbrink, P. Helm, H. Ehmann, E. D. Dunlop (European Commission Ispra, 1998), p. 1260
Light trapping and amorphous/crystalline heterojunctions for silicon thin film solar cells on glass
R. M. Hausner, R. B. Bergmann and J. H. Werner
in: Proc. 2nd World Conference on Photovoltaic Energy Conversion, eds: J. Schmid, H. A. Ossenbrink, P. Helm, H. Ehmann, E. D. Dunlop (European Commission Ispra, 1998), p. 1754
High resolution ebic imaging of polycrystalline silicon solar cells
A. B. Sproul, T. Puzzer, and R. B. Bergmann
in: Proc. 2nd World Conference on Photovoltaic Energy Conversion, eds: J. Schmid, H. A. Ossenbrink, P. Helm, H. Ehmann, E. D. Dunlop (European Commission Ispra, 1998), p. 1355
Low temperature Si-epitaxy with high deposition rate using ion assisted deposition
R. B. Bergmann, C. Zaczek, N. Jensen, S. Oelting, and J. H. Werner
Applied Physics Letters 72, 2996 (1998)
Growth mechanisms in laser crystallization and laser interference crystallization
G. Aichmayr, D. Toet, M. Mulato, P. V. Santos, A. Spangenberg, and R. B. Bergmann
J. Non-Crystalline Solids 227/230, 921 (1998)
Nucleation and Growth of Crystalline Silicon Films on Glass for Solar Cells
R. B. Bergmann, J. Köhler, R. Dassow, C. Zaczek and J. H. Werner
Physica Status Solidi (a) 166, 587 (1998)
Non-coarsening origin of log-normal size distributions during crystallization of amorphous films
R. B. Bergmann, F. G. Shi and J. Krinke
Physical Review Letters 80, 1011 (1998)
Formation of Semiconductors with Log-Normal Grain Size Distributions
R. B. Bergmann, F. G. Shi, H. J. Queisser and J. Krinke
Applied Surface Science 123/124, 376 (1998)
High-efficiency drift-field thin-film silicon solar cells grown on electronically inactive substrates
G. F. Zheng, W. Zhang, Z. Shi, D. Thorp, R. B. Bergmann, M. A. Green
Solar Energy Materials and Solar Cells 51, 95 (1998)
1997
Transport analysis for polycrystalline silicon solar cells on glass substrates
R. Brendel, R. B. Bergmann, B. Fischer, J. Krinke, R. Plieninger, U. Rau, J. Reiß, H. P. Strunk, H. Wanka, and J. H. Werner
in: Proc. 26th Photov. Specialists Conf., (IEEE, Picataway, 1997), p. 635
Zone melt recrystallization of silicon films on glass
R. B. Bergmann, C. Hebling, and J. H. Werner
in: Proc. 14th Europ. Photovoltaic Solar Energy Conf., Hrsg. H. A. Ossenbrink, P. Helm, and H. Ehmann (Stephens & Assoc., Bedford, 1997), p. 1464
Polycrystalline Silicon Films on Glass for Solar Cells by Ion-Assisted Deposition
J. Kühnle, R. B. Bergmann, S. Oelting, J. Krinke, H. P. Strunk, J. H. Werner
in: Proc. 14th Europ. Photovoltaic Solar Energy Conf., Hrsg. H. A. Ossenbrink, P. Helm, and H. Ehmann, (Stephens & Assoc., Bedford, 1997), p. 1022
Optical and structural characterization of silicon microstructures fabricated by laser interference crystallization
D. Toet, G. Aichmayr, M. Mulato, P. V. Santos, A. Spangenberg and R. B. Bergmann
Mat. Res. Soc. Symp. Proc. 467, 337 (1997)
Deposition and characterization of polycrystalline silicon films for thin film solar cells on glass substrates“
R. B. Bergmann, J. Krinke, H. P. Strunk, and J. H. Werner
Mat. Res. Soc. Symp. Proc. 467, 352 (1997)
Crystalline silicon films on a novel high temperature glass for applications in microelectronics and photovoltaics
R. B. Bergmann, J. G. Darrant, A. R. Hyde, and J. H. Werner,
J. Non-Cryst. Solids 218, 388 (1997)
Fabrication of single crystalline SiC layer on high temperature glass
Q.-Y. Tong, T.-H. Lee, P. Werner and U. Gösele, R. B. Bergmann and J. H. Werner
J. Electrochem. Soc. 144, L111 (1997)
Large grained polycrystalline silicon films by solid phase crystallization of phosphorus doped amorphous silicon
R. B. Bergmann and J. Krinke
J. Crystal Growth 177, 191 (1997)
Solid phase crystallized Si films on glass substrates for thin film solar cells
R. B. Bergmann, G. Oswald, M. Albrecht and V. Gross
Solar Energy Materials and Solar Cells 46, 147 (1997)
Ultrathin crystalline silicon solar cells on glass substrates
R. Brendel, R.B. Bergmann, P. Lölgen, M. Wolf, and J.H. Werner
Appl. Phys. Letters 70, 390 (1997)
Growth of polycrystalline silicon films on glass by high temperature chemical vapor deposition
R. B. Bergmann, R. Brendel, M. Wolf, P. Lölgen, J. Krinke, H.P. Strunk and J.H. Werner
Semiconductor Science and Technology 12, 224 (1997)
Role of critical grain size of nuclei for homoepitaxy of polycrystalline Si
J. Kühnle, R. B. Bergmann, and J.H. Werner
J. Crystal Growth 173, 62 (1997)
Large area polycrystalline silicon thin films grown by laser-induced nucleation and solid phase crystallization
D. Toet, B. Koopmans, R.B. Bergmann, B. Richards, P.V. Santos, M. Albrecht, and J. Krinke
Thin Solid Films 296, 49 (1997)
1996
Growth of polycrystalline silicon on glass by selective laser-induced nucleation
D. Toet, B. Koopmans, P. V. Santos, R.B. Bergmann and B. Richards
Appl. Phys. Letters 69, 3719 (1996)
Crystalline silicon films by chemical vapor deposition on glass for thin film solar cells
R. B. Bergmann, R. Brendel, M. Wolf, P. Lölgen, J.H. Werner, J. Krinke, and H.P. Strunk
Proc. 25th IEEE PVSEC, (IEEE, Piscataway, 1996), p. 365
Comparison of vapor phase and liquid phase epitaxy for deposition of crystalline Si on glass
J. Kühnle, R.B. Bergmann, J. Krinke, and J.H. Werner
Mat. Res. Soc. Symp. Proc. 426, 111 (1996)
Growth of polycrystalline silicon using selective nucleation by laser interference crystallization
D. Toet, P.V. Santos, R. B. Bergmann, G. Aichmayr and M. Heintze
Proc. 23rd Internat. Conf. on the Physics of Semiconductors, Eds.: M. Scheffler and R. Zimmermann (World Scientifc, Singapore, 1996), p. 1123
Optical in-situ monitoring of solid phase crystallization of amorphous silicon
R. B. Bergmann
J. Crystal Growth 165, 341 (1996)
Silicon surface passivation by metal layers for low-temperature epitaxy
Jürgen Kühnle, Ralf Bergmann, Jürgen H. Werner, and Martin Albrecht
J. Crystal Growth 163, 470 (1996)
Polycrystalline silicon on glass substrates for thin film solar cells
R. Bergmann, G. Oswald, M. Albrecht, and J. H. Werner
Solid State Phenomena 51-52, 515 (1996)
The effects of solvent and dopant impurities on the performance of LPE silicon solar cells
Z. Shi, W. Zhang, G. F. Zheng, V. L. Chin, A. Stephens, M. A. Green and R. Bergmann
Solar Energy Materials and Solar Cells 41/42, 53 (1996)
1993-1995
The growth and properties of liquid phase epitaxial silicon in a forming gas ambient
Z. Shi, W. Zhang, G.F. Zheng, J. Kurianski, M.A. Green and R. Bergmann, J. Crystal Growth 151, 278 (1995)
Polycrystalline silicon for thin film solar cells
R. Bergmann, J. Kühnle, J.H. Werner, S. Oelting, M. Albrecht, H.P. Strunk, K. Herz and M. Powalla
in: Proc. 1st World Conf. on Photovoltaic Energy Conversion, (IEEE, Piscataway, 1994), p. 1398-1401
Thin film silicon solar cells by LPE and substrate thinning techniques
Z. Shi, G.F. Zheng, W. Zhang, S.J. Robinson, M.A. Green, and R. Bergmann
in: Proc. 12th European Photovoltaic Solar Energy Conference, Eds.: R. Hill, W. Palz, P. Helm (H.S. Stephens & Associates, Bedford, 1994), p. 1835
Opto-electronic characterisation of thin-film crystalline silicon solar cells grown from metal solutions
S.J. Robinson, G-F. Zheng, W. Zhang, Z. Shi, M.A. Green, and R. Bergmann
in: Proc. 12th European Photovoltaic Solar Energy Conference, Eds.: R. Hill, W. Palz, P. Helm (H.S. Stephens & Associates, Bedford, 1994), p. 1831
The challenge of crystalline thin film silicon solar cells
J.H. Werner, R. Bergmann, and R. Brendel
in: Festkörperprobleme / Advances in Solid State Physics Vol. 34, Ed: R. Helbig (Vieweg, Braunschweig, 1994), p. 115 – 146
Kristallzüchtung für die Photovoltaik – Forschung in Deutschland“ (Crystal Growth for Photovoltaics – Research in Germany)
R. Bergmann and J.H. Werner
Mitteilungsblatt der Deutschen Gesellschaft für Kristallwachstum und Kristallzüchtung Vol. 59 (German Society for Crystal Growth), May 1994, p.15
Solution growth of silicon on Al-Si coated quartz glass substrates
S.H. Lee, R. Bergmann, E. Bauser and H.J. Queisser
Materials Letters 19, 1 (1994)
Thin film silicon solar cells on glass by substrate thinning
G.F. Zheng, Z. Shi, R. Bergmann, X. Dai, S. Robinson, A. Wang, J. Kurianski and M.A. Green
Solar Energy Materials and Solar Cells 32, 129 (1994)
Silicon films incorporating a drift-field grown by liquid phase epitaxy for solar cell applications
R. Bergmann, S. Robinson, Z. Shi and J. Kurianski
Solar Energy Materials and Solar Cells 31, 447 (1993)
The role of hydrogen in silicon liquid phase epitaxy
R. Bergmann and J. Kurianski
Materials Letters 17, 137 (1993)
1988-1992
Investigation of epitaxial lateral overgrowth by x-ray topography
R. Köhler, B. Jenichen, E. Bauser and R. Bergmann
J. Appl. Phys. 72, 405 (1992)
High quality GexSi1-x by heteroepitaxial lateral overgrowth
P. O. Hansson, A. Gustafsson, M. Albrecht, R. Bergmann, H.P. Strunk, and E. Bauser
J. Crystal Growth 121, 790 (1992)
First MOS transistors on insulator by silicon saturated liquid solution epitaxy
R. P. Zingg, N. Nagel, R. Bergmann, E. Bauser, B. Höfflinger and H. .J. Queisser
IEEE Electron Device Letters 13, 294 (1992)
Selective liquid-phase epitaxy of silicon for microelectronics applications
N. Nagel, R. P. Zingg, R. Bergmann, and E. Bauser
in: Micro Systems Technologies ’92, Ed. H. Reichl (VDE-Verlag, Berlin, 1992), p. 135
MOS-transistors with epitaxial Si, laterally grown over SiO2 by liquid phase epitaxy
R. Bergmann, E. Czech, I. Silier, N. Nagel, E. Bauser, H. .J. Queisser, R. P. Zingg and B. Höfflinger
Appl. Phys. A 54, 103 (1992)
Epitaxial lateral overgrowth of silicon on SiO2 investigated by x-ray topography
B. Jenichen, R. Köhler, N. Nagel, R. Bergmann, and E. Bauser
in: Mechanisms of Heteroepitaxial Growth, Mat. Res. Soc. Symp. Vol. 263, Eds.: M.F. Chisholm, R. Hull, L.J. Schowalter, B.J. Garrison, (Mater. Res. Soc., Pittsburgh, 1992) p.215
Heteroepitaxial lateral overgrowth of GexSi1-x over SiO2/Si structures by liquid phase epitaxy
P.O. Hansson, R. Bergmann and E. Bauser
J. Crystal Growth 114, 573 (1991)
Dislocation generation in silicon grown laterally over SiO2 by liquid phase epitaxy
F. Banhart, R. Bergmann, F. Phillipp, and E. Bauser
Appl. Physics A 53, 317 (1991)
Model for defect-free epitaxial lateral overgrowth of Si over SiO2 by liquid phase epitaxy
R. Bergmann
J. Crystal Growth 110, 823 (1991)
Silicon layers grown over SiO2 by liquid phase epitaxy – an electron microscopical study
F. Banhart, F. Phillipp, R. Bergmann, E. Czech, M. Konuma, and E. Bauser
in: Proc. 12th Int. Congress for Electron Microscopy, Seattle WA, Vol.4, Eds.: L.D. Peachey, D.B. Williams, (San Francisco Press, San Francisco, 1990) p.566
Defect-free epitaxial lateral overgrowth of oxidized (111) Si by liquid phase epitaxy
R. Bergmann, E. Bauser and J. H. Werner
Appl. Phys. Lett. 57, 351 (1990)
Determination of recombination parameters in silicon solar cells using light induced transients
W. Warta, R. Bergmann, and B. Voss
in: Proc. 8th E.C. Photovoltaic Solar Energy Conference, Eds.: I. Solomon, B. Equer and P. Helm (Kluver Academic Publishers, Dordrecht, 1988) Vol.2, p.1416